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Volume 11 - October 2005

Contents

Page 42 of 61

Scanning Electron Microscopy and X-ray Microanalysis the Next 35 Years: A Symposium Celebrating Joe Goldstein's 65th Birthday

Research Article

  • Stress Relaxation and Evolution of Surface Microstructure During Tensile and Compressive Loading of Polymer Nanocomposites

  • S Shanmugam, R D K Misra
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1366-1367
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Effects of Evactron Plasma Cleaning on X-ray Detector Windows

  • E A Kenik, H M Meyer, R Vane, V Carlino
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1368-1369
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Imaging Analytical Studies of Old Master Paints Using FTIR, SIMS and SEMEDX of Embedded Paint Cross Sections

  • J Boon, E S B Ferreira, K Keune
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1370-1371
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Microanalysis of Extraterrestrial Materials: New Techniques and Applications

Research Article

  • Advanced Microanalysis Instruments and Techniques for Sample Return Science at the Carnegie Institution of Washington

  • L R Nittler, C M O Alexander, E Hauri
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1372-1373
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • MegaSIMS: A High Energy Secondary Ion Mass Spectrometer for the Analysis of Captured Solar Wind.

  • K D McKeegan, C D Coath, G Jarzebinski, T Kunihiro, P H Mao
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1376-1377
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Towards Isotope Ratio Measurement with an Electrometer Array on the Cameca IMS xf

  • P Williams, J Lorincik, R L Hervig, L Leshin, M B Denton, R Sperline, G Slodzian
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1378-1379
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • The Stardust Comet Sample Return Mission and the Application of Microbeam Analyses on Small Particles.

  • D E Brownlee
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1380-1381
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Quantitative X-ray Spectrum Imaging of Extraterrestrial Materials with a Field-Emission STEM

  • L P Keller
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1382-1383
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Monochromated TEM/STEM and High-Resolution Electron Energy-Loss Spectroscopy (HREELS) of Extraterrestrial Materials

  • Z R Dai, J P Bradley, G Graham, R Erni, N Browning
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1384-1385
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Focused Ion Beam Slicing of Cosmic Dust for Coordinated Structure-Isotope Studies

  • R M Stroud
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1386-1387
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Coordinated TEM and NanoSIMS of Presolar Graphites

  • T K Croat, F J Stadermann, T J Bernatowicz
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1388-1389
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • New Electron Microscopy Techniques for the Study of Meteoritic Metal

  • J I Goldstein, J R Michael, P G Kotula, R H Jones
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1392-1393
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • The Application of Dual Beam FIB Techniques to the Preparation of TEM Sections from Heterogeneous Carbonaceous Chondrites

  • L J Chizmadia, Y Xu, C Schwappach, A J Brearley
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1394-1395
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • High Resolution Phase Contrast X-ray Imaging of Cosmic Dust Captured in Aerogel

  • J Sheffield-Parker, G A Graham, S C Mayo, N Teslich, P G Grant, C Snead, A J Westphal
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1396-1397
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Characterization of Meteorites, Interplanetary Dust, and Other Extraterrestrial Materials by Confocal Raman Imaging

  • M Fries, A Steele
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1398-1399
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Nano Scale Engineering & Self Assembly

Research Article

  • Self-assembled, Nano-structured 3-d Polymer Spheres: Synthesis and Chemical Characterization by Scanning Transmission X-ray Microscopy

  • A P Hitchcock, G Gao, H D H Stover
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1400-1401
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Determining Forces of Self-Assembly in Thin Films by measuring Thermal Vibrations.

  • K Thuermer
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1402-1403
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Self-Assemble Nanostructures

  • Y M Lam
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1404-1405
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Page 42 of 61