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Volume 11 - October 2005

Contents

Page 41 of 61

Scanning Electron Microscopy and X-ray Microanalysis the Next 35 Years: A Symposium Celebrating Joe Goldstein's 65th Birthday

Research Article

  • Microscopy of Materials Used in the Semiconductor Industry

  • S M Merchant, J M DeLucca, K N Hooghan, F A Baiocchi
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1326-1327
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • The New X-ray Mapping: Applying the Silicon Drift Detector (SDD) for X-ray Spectrometry and Spectrum Imaging with Output Count Rates above 100 kHz

  • D E Newbury
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1328-1329
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Throughput in Quantitative Analysis--from 23 Elements per Point to 50,000 Points per Element

  • J J Friel
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1330-1331
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Is the Energy Loss of Scattered Primary Electrons a Further Complication with X-ray Microanalysis in VPSEM?

  • B J Griffin, C Nockolds
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1332-1333
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • On the Representation of Beam/Specimen Interactions

  • A Deal, A Eades
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1334-1335
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Quantitative X-ray Microanalysis of Bare Insulating Materials

  • C E Lyman
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1336-1337
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • 3D Chemical Imaging at the Nanoscale

  • J H J Scott, N W M Ritchie
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1338-1339
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • X-ray Microanalysis of Nanoparticles in the Scanning Electron Microscope

  • J A Small, N W M Ritchie
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1340-1341
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Quantitative X-Ray Microanalysis in the Analytical Electron Microscope

  • R Gauvin
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1342-1343
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Analysis of Iron Meteorites Using Computed Tomography and Electron-probe Microanalysis

  • P Carpenter, D Gillies
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1344-1345
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • The Validation of Monte Carlo Methods for Scanning Electron Microscopy and Electron Microprobe Analysis

  • E Lifshin, B Thiel, R Gauvin
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1346-1347
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Focused Ion Beam Induced X-Ray Analysis

  • L A Giannuzzi
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1348-1349
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Nanofabrication with Ion Beams Visualized in the Environmental Scanning Electron Microscope

  • J Mansfield, R Goldman, R Laine, M Shtein
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1350-1351
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • The In-situ Analysis of Precipitates in Some Mg-Rare Earth Alloys

  • G W Lorimer, G Cliff, P Apps
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1352-1353
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Quantitation Procedures for Electron Probe Microanalysis of Polished Materials, Thin Films and Particles: The Past and Next Thirty Five Years

  • J T Armstrong
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1354-1355
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Digital Imaging: From Grains to Pixels

  • J Mackenzie
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1356-1357
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Microprobe Analysis of Zigzag Diffusion Paths in Multiphase Interdiffusion Regions

  • J E Morral, Y Wang
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1358-1359
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Electrons, X-rays and Archaeometallurgy

  • M R Notis, A N Shugar, D E Newbury
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1360-1361
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • X-ray Analysis in the AEM with Angstrom-Level Spatial Resolution and Single-Atom Detection

  • M Watanabe, D B Williams
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1362-1363
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Diesel Soot in the Electron Microscope

  • J-O Müller, D S Su, E Zeitler
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1364-1365
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Page 41 of 61