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The Application of Dual Beam FIB Techniques to the Preparation of TEM Sections from Heterogeneous Carbonaceous Chondrites

Published online by Cambridge University Press:  01 August 2005

L J Chizmadia ,
Y Xu ,
C Schwappach  and
A J Brearley
L J Chizmadia
Affiliation:
University of Hawaii Honolulu
Y Xu
Affiliation:
Intel Corporation
C Schwappach
Affiliation:
Intel Corporation
A J Brearley
Affiliation:
University of New Mexico

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 1394 - 1395
Copyright
© 2005 Microscopy Society of America