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Nion UltraSTEM: An Aberration-Corrected STEM for Imaging and Analysis

Published online by Cambridge University Press:  01 August 2005

N J Bacon ,
G J Corbin ,
N Dellby ,
P Hrncirik ,
O L Krivanek ,
A McManama-Smith ,
M F Murfitt  and
Z S Szilagyi
N J Bacon
Affiliation:
Nion Co.
G J Corbin
Affiliation:
Nion Co.
N Dellby
Affiliation:
Nion Co.
P Hrncirik
Affiliation:
Nion Co.
O L Krivanek
Affiliation:
Nion Co.
A McManama-Smith
Affiliation:
Nion Co.
M F Murfitt
Affiliation:
Nion Co.
Z S Szilagyi
Affiliation:
Nion Co.

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 1422 - 1423
Copyright
© 2005 Microscopy Society of America