Microscopy and Microanalysis: Volume 14 -

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Volume 14 - August 2008

Contents

Page 43 of 48

Analytical Electron Microscopy: Advanced Techniques and Applications for Nanoscience

Research Article

Uranium Single Atom Imaging And EELS Mapping using Aberration Corrected Scanning Transmission Electron Microscope and LN2 Cold Stage
H Inada, J Wall, Y Zhu, V Volkov, K Nakamura, M Konno, K Jarausch
Published online by Cambridge University Press:

03 August 2008, pp. 1386-1387
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Ultrastructure of a Metal/Superconductor Interface Revealed by Atomic-Resolution STEM Techniques
Y Xin, LF Allard, ZQ Mao
Published online by Cambridge University Press:

03 August 2008, pp. 1388-1389
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Analysis of Catalysts using Aberration-Corrected TEM
S Rozeveld, DA Blom, LF Allard, T Richardson, C Todd, JH Blackson
Published online by Cambridge University Press:

03 August 2008, pp. 1390-1391
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Influence of Au electrodes on the properties of SrTiO3/La0.67Sr0.33MnO3/Au magnetic tunnel junctions studied by bberration-corrected STEM-EELS
C Magen, M Varela, SJ Pennycook, S Brivio, D Petti, M Cantoni, R Bertacco
Published online by Cambridge University Press:

03 August 2008, pp. 1392-1393
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Nanoscale EELS and EDX Analyses of GaN Nanowires and GaN/AlGaN Radial Heterostructure Nanowires
L Lari, RT Murray, MH Gass, T Bullough, PR Chalker, C Chèze, L Geelhaar, H Riechert
Published online by Cambridge University Press:

03 August 2008, pp. 1394-1395
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Probing the Composition Variations in Nanoscale Multilayers
A Genç, R Banerjee, AWS Johnson, HL Fraser
Published online by Cambridge University Press:

03 August 2008, pp. 1396-1397
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Z-Contrast Imaging and EELS Study of Supported CoPd Nano-Catalyst
Y Zhao, L D’Souza, JR Regalbuto, RF Klie
Published online by Cambridge University Press:

03 August 2008, pp. 1398-1399
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Optimization of Acquisition Parameters for Atomic-Column Electron Energy-Loss Spectrum Imaging in a JEM-2200FS Aberration-Corrected Scanning Transmission Electron Microscope
M Watanabe, M Kanno, D Ackland, CJ Kiely, DB Williams
Published online by Cambridge University Press:

03 August 2008, pp. 1400-1401
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Atomic Investigation of Al2O3/GaN Heterostructures Interfaces using Aberration-Corrected STEM Combined with First-Principles Methods
JC Idrobo, P Pant, J Narayan, SJ Pennycook, ST Pantelides
Published online by Cambridge University Press:

03 August 2008, pp. 1402-1403
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

3D Elemental Mapping Using a Dedicated STEM Equipped with a Real-Time EELS Imaging System
T Yaguchi, K Kaji, H Kikuchi, M Miyakawa, H Okushima, M Konno, T Kamino
Published online by Cambridge University Press:

03 August 2008, pp. 1404-1405
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Effects of Pretreatments on the Growth Mechanisms of Ultra-Nanocrystalline Diamond Films: a Chemical Bonding Mapping Approaching
XY Zhong, YC Chen, NH Tai, IN Lin, JM Hiller, O Auciello, B Kabius
Published online by Cambridge University Press:

03 August 2008, pp. 1406-1407
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Is there still a place for aberration corrected user facilities?
MH Gass, P Wang, K Sader, B Mendis, I Godfrey, A Bleloch
Published online by Cambridge University Press:

03 August 2008, pp. 1408-1409
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

A Comparison of Theoretical and Experimental Cross-Sections for EELS Quantification at 200 kV Incident Electron Energy
Q Jin, S Wang
Published online by Cambridge University Press:

03 August 2008, pp. 1410-1411
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Use of Fourier-ratio deconvolution for processing low-loss EELS spectra
F Wang, R Egerton, M Malac
Published online by Cambridge University Press:

03 August 2008, pp. 1412-1413
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

HRTEM Characterization of Precipitates in Structural Microalloyed Steels
L Béjar-Gómez, A Medina-Flores, A Bedolla-Jacuinde, JA Ascencio
Published online by Cambridge University Press:

03 August 2008, pp. 1414-1415
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

TEM Characterization of Tensile-Tested 14YWT Nanostructured Ferritic Alloys
J Bentley, DT Hoelzer
Published online by Cambridge University Press:

03 August 2008, pp. 1416-1417
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Microscopy Techniques for Ceramics and Composites

Research Article

Quantitative STEM Tomography for Size-controlled Metallic Nanodots on Sintered Titania Photocatalysts
K Yoshida, L Miao, T Hirayama, S Tanemura, T Torimoto, N Tanaka
Published online by Cambridge University Press:

03 August 2008, pp. 1418-1419
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

EDX Analysis of Grain Boundary Segregation in 1 at% Nd Doped Polycrystalline YAG
X Li, A Stevenson, G Messing, EC Dickey
Published online by Cambridge University Press:

03 August 2008, pp. 1420-1421
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

High Resolution STEM, EELS, and STEM Tomography of Ceramic Materials
I Arslan
Published online by Cambridge University Press:

03 August 2008, pp. 1422-1423
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Electron Microprobe Analysis of Glass-to-Metal Seals For Use in Solid-Oxide Fuels
SJ Widgeon, EL Corral, RE Loehman
Published online by Cambridge University Press:

03 August 2008, pp. 1424-1425
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Page 43 of 48

Microscopy and Microanalysis

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Volume 14 - August 2008

Analytical Electron Microscopy: Advanced Techniques and Applications for Nanoscience

Research Article

Uranium Single Atom Imaging And EELS Mapping using Aberration Corrected Scanning Transmission Electron Microscope and LN2 Cold Stage

Ultrastructure of a Metal/Superconductor Interface Revealed by Atomic-Resolution STEM Techniques

Analysis of Catalysts using Aberration-Corrected TEM

Influence of Au electrodes on the properties of SrTiO3/La0.67Sr0.33MnO3/Au magnetic tunnel junctions studied by bberration-corrected STEM-EELS

Nanoscale EELS and EDX Analyses of GaN Nanowires and GaN/AlGaN Radial Heterostructure Nanowires

Probing the Composition Variations in Nanoscale Multilayers

Z-Contrast Imaging and EELS Study of Supported CoPd Nano-Catalyst

Optimization of Acquisition Parameters for Atomic-Column Electron Energy-Loss Spectrum Imaging in a JEM-2200FS Aberration-Corrected Scanning Transmission Electron Microscope

Atomic Investigation of Al2O3/GaN Heterostructures Interfaces using Aberration-Corrected STEM Combined with First-Principles Methods

3D Elemental Mapping Using a Dedicated STEM Equipped with a Real-Time EELS Imaging System

Effects of Pretreatments on the Growth Mechanisms of Ultra-Nanocrystalline Diamond Films: a Chemical Bonding Mapping Approaching

Is there still a place for aberration corrected user facilities?

A Comparison of Theoretical and Experimental Cross-Sections for EELS Quantification at 200 kV Incident Electron Energy

Use of Fourier-ratio deconvolution for processing low-loss EELS spectra

HRTEM Characterization of Precipitates in Structural Microalloyed Steels

TEM Characterization of Tensile-Tested 14YWT Nanostructured Ferritic Alloys

Microscopy Techniques for Ceramics and Composites

Research Article

Quantitative STEM Tomography for Size-controlled Metallic Nanodots on Sintered Titania Photocatalysts

EDX Analysis of Grain Boundary Segregation in 1 at% Nd Doped Polycrystalline YAG

High Resolution STEM, EELS, and STEM Tomography of Ceramic Materials

Electron Microprobe Analysis of Glass-to-Metal Seals For Use in Solid-Oxide Fuels

Microscopy and Microanalysis

Refine listing

Actions for selected content:

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Volume 14 - August 2008

Analytical Electron Microscopy: Advanced Techniques and Applications for Nanoscience

Research Article

Microscopy Techniques for Ceramics and Composites

Research Article