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Use of Fourier-ratio deconvolution for processing low-loss EELS spectra

Published online by Cambridge University Press:  03 August 2008

F Wang ,
R Egerton  and
M Malac
F Wang
Affiliation:
National Institute for Nanotechnology, Canada
R Egerton
Affiliation:
National Institute for Nanotechnology, Canada
M Malac
Affiliation:
National Institute for Nanotechnology, Canada
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1412 - 1413
Copyright
© 2008 Microscopy Society of America

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