Hostname: page-component-7bb8b95d7b-s9k8s Total loading time: 0 Render date: 2024-09-12T11:22:17.316Z Has data issue: false hasContentIssue false
  • English
  • Français

A Comparison of Theoretical and Experimental Cross-Sections for EELS Quantification at 200 kV Incident Electron Energy

Published online by Cambridge University Press:  03 August 2008

Q Jin  and
S Wang
Q Jin
Affiliation:
Micron Technology Inc
S Wang
Affiliation:
Micron Technology Inc
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1410 - 1411
Copyright
© 2008 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)