Most cited
This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
- Cited by 3
Developments in Large Volume 3D Analysis via P-FIB: EBSD & EDS
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- Published online by Cambridge University Press:
- 04 August 2017, pp. 284-285
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Determining the Polarization Fraction of Thin Film Ferroelectric HZO with STEM EBIC
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- Published online by Cambridge University Press:
- 22 July 2022, pp. 2270-2271
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- Cited by 3
Towards Quantitative Electron-Holographic Tomography
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- Published online by Cambridge University Press:
- 07 September 2007, pp. 112-113
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Morphological Study of Sub-nanometer Noble Metal Clusters by Electron Beam-Assisted Redistribution
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- Published online by Cambridge University Press:
- 23 November 2012, pp. 1036-1037
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Multi-Beam Scanning Electron Microscope Design
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- Published online by Cambridge University Press:
- 25 July 2016, pp. 574-575
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Multiple Orientation Relationships Among Nanocrystals of Manganese Oxides
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- Published online by Cambridge University Press:
- 19 July 2003, pp. 402-403
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Quantitative Composition Maps of Magnetic Recording Media by EFTEM
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- Published online by Cambridge University Press:
- 02 July 2020, pp. 634-635
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The Prospect of Spatially Accurate Reconstructed Atom Probe Data Using Experimental Emitter Shapes
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- Published online by Cambridge University Press:
- 05 November 2021, pp. 1141-1149
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Selective Detection of Backscattered Electrons in the Compound Lens Equipped UHR SEM
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- Published online by Cambridge University Press:
- 25 July 2016, pp. 576-577
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Unraveling the Architecture and Structural Dynamics of Pathogens by High-Resolution in vitro Atomic Force Microscopy
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- Published online by Cambridge University Press:
- 30 December 2005, pp. 32-35
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Resolution Quality and Atom Positions in Sub-Ångström Electron Microscopy
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- Published online by Cambridge University Press:
- 01 August 2005, pp. 540-541
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Characterizing the Geometric Detection Efficiency of EDX Detectors
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- Published online by Cambridge University Press:
- 23 September 2015, pp. 1479-1480
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Reflector Selection for the Indexing of Electron Backscatter Diffraction Patterns
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- Published online by Cambridge University Press:
- 27 March 2019, pp. 675-681
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Atom Probe Tomography Analysis of Thick Film SiO2 and Oxide Interfaces: Conditions Leading to Improved Analysis Yield
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 750-751
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Specimen Preparation of Difficult Materials for EBSD Characterization
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- Published online by Cambridge University Press:
- 09 April 2017, pp. 414-415
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A Miniature Low Voltage SEM with High Resolution
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- Published online by Cambridge University Press:
- 02 July 2020, pp. 322-323
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Imaging At the Timescale Of Micro- and Milliseconds With the pnCCD (S)TEM Camera
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- Published online by Cambridge University Press:
- 23 September 2015, pp. 1585-1586
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Understanding the Battery Degradation Mechanism in All-solid-state Batteries via In-situ SEM
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- Published online by Cambridge University Press:
- 03 December 2021, pp. 105-106
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The Microstructure of Pharmaceutical Materials Revealed by Scanning Electron Diffraction
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- Published online by Cambridge University Press:
- 04 August 2017, pp. 1192-1193
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Understanding Radiation Damage in Beam-Sensitive TEM Specimens
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- Published online by Cambridge University Press:
- 30 July 2020, pp. 84-86
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