Microscopy and Microanalysis: Volume 23 - Proceedings of Microscopy & Microanalysis 2017

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2017

Analytical and Instrumentation Science Symposia

Advances in Scanning Electron Microscopy: Transmission Modes and Channeling Effects

Abstract

Revised Algorithm for Image Sharpness Measurement in Scanning Electron Microscopy Based on Derivative Method in ISO/TS 24597 Document

Anniversary Session: Instrumentation of Atom Probe: 50 Years and Counting

Abstract

A Personal Retrospective on the Origin of the Time-of-Flight Atom Probe

My Life with Erwin: The Beginning of an Atom-Probe Legacy

Field Emission Microscopy to Study the Catalytic Reactivity of Binary Alloys at the Nanoscale.

Enabling Atom Probe Analyses of New Materials Classes with Vacuum-Cryo-Transfer Capabilities

The Pulsed-Laser Atom Probe: A Review of Its Development and Initial Applications

Evolution of Atom Probe Data Collection Toward Optimized and Fully Automated Acquisition

On the Multiple Event Detection in Atom Probe Tomography

Simplifying Observation of Hydrogen Trapping in Atom Probe Tomography

Applications, Technical Challenges, and Recent Implementation of a UHV/Cryogenic Specimen Transfer System for Atom Probe Tomography

Interlaboratory Study: Laser-assisted Atom Probe Tomography (APT) of a Phosporous-Doped Silicon Specimen

Nanoscale Chiral Recognition Using Field Ion and Field Emission Microscopy

Laser-Induced Reversion of δ′ precipitates in an Al-Li Alloy

Reconstruction, Simulations, and Data Analysis in Atom Probe Tomography

Abstract

Correlating Irradiation-Induced Solute Clustering with Changes of Hardness in Low and High Flux Reactor Pressure Vessel Steels

Exploring Artifact Signals in Atom Probe Mass Spectra

Field Evaporation Behavior of Ternary Compound Semiconductor InxAli-xN

Recent Reconstruction Developments in IVAS

Reconstructing APT Datasets: Challenging the Limits of the Possible

High Fidelity Reconstruction of Experimental Field Ion Microscopy Data by Atomic Relaxation Simulations

Atomistic Simulations of Surface Effects Under High Electric Fields

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2017

Analytical and Instrumentation Science Symposia

Advances in Scanning Electron Microscopy: Transmission Modes and Channeling Effects

Abstract

Anniversary Session: Instrumentation of Atom Probe: 50 Years and Counting

Abstract

Reconstruction, Simulations, and Data Analysis in Atom Probe Tomography

Abstract