Hostname: page-component-77c89778f8-fv566 Total loading time: 0 Render date: 2024-07-22T22:50:51.396Z Has data issue: false hasContentIssue false
  • English
  • Français

Atomistic Simulations of Surface Effects Under High Electric Fields

Published online by Cambridge University Press:  04 August 2017

Stefan Parviainen ,
Michal Dagan ,
Shyam Katnagallu ,
Baptiste Gault ,
Michael Moody  and
Francois Vurpillot
Stefan Parviainen
Affiliation:
GPM UMR 6634 CNRS, Universite et INSA de Rouen, Rouen, FRANCE
Michal Dagan
Affiliation:
Department of Materials, University of Oxford, UK
Shyam Katnagallu
Affiliation:
Max-Planck Institut fur Eisenforschung, Dusseldorf, Germany
Baptiste Gault
Affiliation:
Max-Planck Institut fur Eisenforschung, Dusseldorf, Germany
Michael Moody
Affiliation:
Department of Materials, University of Oxford, UK
Francois Vurpillot
Affiliation:
GPM UMR 6634 CNRS, Universite et INSA de Rouen, Rouen, FRANCE

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 644 - 645
Copyright
© Microscopy Society of America 2017 

References

[1] Bas, P., et al, Appl Surf. Sci. 87/88 1995). p. 298.Google Scholar