Hostname: page-component-7479d7b7d-t6hkb Total loading time: 0 Render date: 2024-07-10T07:19:15.783Z Has data issue: false hasContentIssue false
  • English
  • Français

Recent Reconstruction Developments in IVAS

Published online by Cambridge University Press:  04 August 2017

Brian P. Geiser ,
Francois Vurpillot ,
Yimeng Chen ,
Katherine P. Rice ,
Stuart Wright ,
David A. Reinhard ,
Geoff Sobering ,
Robert M. Ulfig  and
David J. Larson
Brian P. Geiser
Affiliation:
CAMECA Instruments Inc., Madison, WI, 53711USA.
Francois Vurpillot
Affiliation:
Groupe de Physique des Matériaux, UMR CNRS 6634, Université et INSA de Rouen, France.
Yimeng Chen
Affiliation:
CAMECA Instruments Inc., Madison, WI, 53711USA.
Katherine P. Rice
Affiliation:
CAMECA Instruments Inc., Madison, WI, 53711USA.
Stuart Wright
Affiliation:
EDAX, Draper, UT, 84020USA.
David A. Reinhard
Affiliation:
CAMECA Instruments Inc., Madison, WI, 53711USA.
Geoff Sobering
Affiliation:
CAMECA Instruments Inc., Madison, WI, 53711USA.
Robert M. Ulfig
Affiliation:
CAMECA Instruments Inc., Madison, WI, 53711USA.
David J. Larson
Affiliation:
CAMECA Instruments Inc., Madison, WI, 53711USA.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 638 - 639
Copyright
© Microscopy Society of America 2017 

References

[1] The authors acknowledge funding from the Recherche Technologique de Base (RTB) and the French National Agency (Project no. APTITUDE ANR-12-NANO-0001).Google Scholar
[2] Vurpillot, F., Gaillard, A., DaCosta, G. & Deconihout, B. Ultramicroscopy 132 2013 152–157.CrossRefGoogle Scholar
[3] Gault, B., Moody, M. P., de Geuser, F., Tsafnat, G., La Fontaine, A., Stephenson, L. T., Haley, D. & Ringer, S. P. J Appl Phys 105 2009 034913/1–9.CrossRefGoogle Scholar
[4] Adams, B. L., Wright, S. I. & Kunze, K. Metallurgical Transactions A 24(no. 4 1993 819–831.CrossRefGoogle Scholar