Microscopy and Microanalysis: Volume 22 - Proceedings of Microscopy & Microanalysis 2016

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2016

Analytical and Instrumentation Science Symposia

Quantitative Measurement of Intensities and Distances in Electron Microscopy

Abstract

An Extended Ageing Study of a Uranium Dioxide Layer on Uranium Metal using the EDS/XPP Method

Electron Beam Induced Mass Loss Dependence on Stained Thin Epon Resin Sections

Image Processing of Energy Filtered Transmission Electron Microcopy Maps in Order to Extract Nano Scale Magnetic Properties of CoCr-based Magnetic Thin Films

Oxygen Octahedral Picker: A Digital Micrograph Script Tool for Extracting Quantitative Information From HAADF and ABF Images

Extraction of Quantitative Information from Non-optimum-focus Aberration-corrected HRTEM Images by Image Processing

Effect of Probe Channeling on Differential Phase Contrast at the Atomic Scale

Evaluation of Electron Microscopy Techniques for the Purpose of Classification of Nanomaterials.

High-Throughput, Semi-Automated Quantitative STEM Atom Counting in Supported Metal Nanoparticles Using a Conventional TEM/STEM

Development of Real-Time Probe Current Calibration for Performing Quantitative STEM with a Cold Field-Emission Gun.

Exploring Boltzmann-Factor Distributions of Precipitation-Nuclei in the TEM.

Determining Interplanar Distances from STEM-EDX Hyperspectral Maps

Challenges of Oversimplifying Z-contrast in Atomic Resolution ADF-STEM

Local Crystallography for Quantitative Analysis of Atomically Resolved Images

New Frontiers in Monochromated EELS

Abstract

Monochromated EELS to Probe the Local Optical Properties of Low-Dimensional Materials

Opportunities and Challenges in Ultra-High Energy Resolution EELS

Mapping EELS Vibrational Modes in MgO Nanocubes

High Resolution Monochromated EELS Really Is Different!

Monochromated Electron Energy-Loss Spectroscopy of Organic Photovoltaics

Taking Advantage of Scattering Delocalization To Reduce Radiation Damage In Vibrational or Valence-Loss EELS and Energy-Filtered TEM Images

Ultra High Energy Resolution EELS Mapping using Aberration-corrected Low-voltage STEM Equipped with Monochromator

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2016

Analytical and Instrumentation Science Symposia

Quantitative Measurement of Intensities and Distances in Electron Microscopy

Abstract

New Frontiers in Monochromated EELS

Abstract