Microscopy and Microanalysis: Volume 22 - Proceedings of Microscopy & Microanalysis 2016

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2016

Analytical and Instrumentation Science Symposia

In-Situ Electron Microscopy and Big Data Analytics in 2D and 3D

Abstract

In-situ TEM Investigation on Thermal Stability and Oxygen Release Behavior of Charged and Discharged LiCoO2

Single Atom Electron Microscopy and Spectroscopy

Abstract

Electron Diffraction from a Single Atom and Optimal Signal Detection

In-line Holography with Single Atom Sensitivity: Challenges and Achievements

Exploration of Single-Atom X-ray Analysis in an Analytical Electron Microscope

Observation of Single Atoms in Liquid and Liquid Inhomogeneous Structures

Microscopy and Spectroscopy of Catalysts and Energy Storage Materials

Dynamic Aberration-corrected STEM of Bimetallic Nanocatalysts during Surface Diffusion

Atomically Dispersed Precious Metal Species on Various Oxide Supports for Catalytic Hydrogen Upgrading and Emission Control

Catalysis by Supported Single Metal Atoms

Single Atom Imaging and Spectroscopy of Impurities in 2D Materials

Z-contrast imaging as a tool for atomic level analysis of bimetallic structures

Every Atom has a Story to Tell: Using Single-Atom-Sensitivity Imaging and Spectroscopy to Determine Origins of Cosmic Nanodiamonds

Single Atom Spectroscopy in Low-Dimensional Materials using Low-voltage STEM

Strain Accommodation and Coherency in Laterally-Stitched WSe2/WS2Junctions

ZnO Nanowire Supported Metal Single Atoms for CO oxidation

Quantification of the Effects of Small Mistilts on Dopant Visibility in Nanocrystals

Imaging at the Single-Atom Level in Closed-CellIn SituGas Reactions

Performance of the SALVE-microscope: Atomic-resolution TEM Imaging at 20 kV

Engineering the Contrast Transfer through the Cc/Cs Corrected 20-80 kV SALVE Microscope

Correlation Averaging of Single-Atomic-Column STEM-EDX Images for Sub-Atomic Information

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2016

Analytical and Instrumentation Science Symposia

In-Situ Electron Microscopy and Big Data Analytics in 2D and 3D

Abstract

Single Atom Electron Microscopy and Spectroscopy

Abstract