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Performance of the SALVE-microscope: Atomic-resolution TEM Imaging at 20 kV

Published online by Cambridge University Press:  25 July 2016

Martin Linck
Affiliation:
Corrected Electron Optical Systems GmbH, Englerstr. 28, D-69126 Heidelberg, Germany
Peter Hartel
Affiliation:
Corrected Electron Optical Systems GmbH, Englerstr. 28, D-69126 Heidelberg, Germany
Stephan Uhlemann
Affiliation:
Corrected Electron Optical Systems GmbH, Englerstr. 28, D-69126 Heidelberg, Germany
Frank Kahl
Affiliation:
Corrected Electron Optical Systems GmbH, Englerstr. 28, D-69126 Heidelberg, Germany
Heiko Müller
Affiliation:
Corrected Electron Optical Systems GmbH, Englerstr. 28, D-69126 Heidelberg, Germany
Joachim Zach
Affiliation:
Corrected Electron Optical Systems GmbH, Englerstr. 28, D-69126 Heidelberg, Germany
Johannes Biskupek
Affiliation:
Central facility of electron microscopy, Ulm University, Albert-Einstein-Allee 11, D-89081 Ulm, Germany
Marcel Niestadt
Affiliation:
FEI Company, Achtseweg Noord 5, 5651 GG Eindhoven, Netherlands
Ute Kaiser
Affiliation:
Central facility of electron microscopy, Ulm University, Albert-Einstein-Allee 11, D-89081 Ulm, Germany
Max Haider
Affiliation:
Corrected Electron Optical Systems GmbH, Englerstr. 28, D-69126 Heidelberg, Germany
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Abstract

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© Microscopy Society of America 2016 

References

[1] Kaiser, U., et al, Ultramicroscopy 111, Issue 8 (2011) 12391246.CrossRefGoogle Scholar
[3] Rose, H. Proc. 10th Eur. Congr. El. Micr. (Granada, Spain) (1992) 47.Google Scholar
[4] Rose, H. Patent Application DE 42 04 512 A 1 (1992).Google Scholar
[5] Uhlemann, S., et al., Physical Review Letters 111(4 (2013) 046101.CrossRefGoogle Scholar
[6] The authors acknowledge funding from the German Research Foundation (DFG) and the Ministry of Science, Research and the Arts (MWK) of the federal state Baden-Württemberg, Germany.Google Scholar
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Performance of the SALVE-microscope: Atomic-resolution TEM Imaging at 20 kV
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