Microscopy and Microanalysis: Volume 20 - Proceedings of Microscopy & Microanalysis 2014

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure coreplatform@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

Electron Holography at the Atomic Scale and the Nanoscale

Abstract

A New Design for Measuring Potentials in Operando Nanoelectronic Devices by Electron Holography

Vector Field Tomography by Electron Holography

Electron Holographic Tomography of Mean Free Path Lengths at the nm-scale

Hybridization of Off-Axis and In-line High-Resolution Electron Holography

Superposition of Fraunhofer Diffractions from Fork-Shaped Gratings and their Openings with Electron Vortex Beam

Investigation of Effect of Electron Irradiation on Ionic Liquid Using Electron Holography

Electron Holography of the Magnetic Phase Shift of a Current-Carrying Wire

Magnetic Characterization of Isolated CoFeB/Cu Nanowires by Off-Axis Electron Holography

Lens-Less Foucault Imaging (LLFI) Method for Observing Magnetic Domain Walls

Study of Magnetic Domain Structure in Co(Fe)/Pd Multilayers using Off-axis Electron Holography

Imaging Perpendicular Magnetic Domains in Plan-view Using Lorentz Transmission Electron Microscopy

Evaluation of Doping in GaP Core-Shell Nanowire pn Junction by Off-Axis Electron Holography

Characterization of Metallic and Bimetallic Nanoparticles by Off-Axis Electron Holography

Propagation of Free Electrons Carrying Orbital Angular Momentum Through Magnetic Lenses

15 Years of Focused Ion Beams at M & M

Abstract

FIB Applications: A Historical Perspective

Optimization of High Current Xenon Plasma Ion Beams for Applications in Semiconductor Failure Analysis and Development

High Speed TEM Sample Preparation by Xe FIB

He+ Ions for 3D Imaging

Monte Carlo Modeling of Ion Beam Induced Secondary Electrons

1970-2014: From Space Ion Thrusters to Nano-Tools

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

Electron Holography at the Atomic Scale and the Nanoscale

Abstract

15 Years of Focused Ion Beams at M & M

Abstract