Microscopy and Microanalysis: Volume 20 - Proceedings of Microscopy & Microanalysis 2014

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

TEM Phase Contrast Imaging in Biological and Materials Science

Abstract

Ultimate Recovery of Low-Frequencies in Thin-film ZPC-TEM by Inverse Projector

Innovative Phase Plates for Beam Shaping

Charging of Thin Film Phase Plates under Electron Beam Irradiation

Phase Contrast Cryo-Electron Tomography and Single Particle Analysis with a New Phase Plate

Artifact Correction for Zernike Phase-Plate Cryo-Electron Tomography

A Nanocrystalline Hilbert Phase-Plate for Phase-Contrast Transmission Electron Microscopy

CIGS Nanoparticles Observed in TEM Low Dose Condition. Atomic Resolution and Beam Effects

Dual Lens Electron Holography for High Spatial Resolution Junction and Strain Mapping of Semiconductor Devices

SAED and HREM Studies of Zr2Co11 Intermetallic Compound

Electron Holography at the Atomic Scale and the Nanoscale

Abstract

Electron holography: state and prospects

Collective Motion of Secondary Electrons Visualized by Electron Holography

Accumulated Reconstruction Method for Electron Holography

Magnetic Imaging with a Novel Hole-Free Phase Plate

Electron Holography of CMOS Devices with Epitaxial Layers

Field Mapping in Semiconductors by Off-axis Electron Holography: From Devices to Graphene and Single Dopant Atoms

In Situ Biasing of Tapered Si-Ge NW Heterojunctions using Off-Axis Electron Holography

Characterization of N-polar GaN/AlGaN/GaN Heterostructures Using Electron Holography

New Approaches for Measuring Electrostatic Potentials and Charge Density Distributions in Working Devices Using Off-Axis and In-Line Electron Holography

A Newly Developed 1.2MV Field Emission Transmission Electron Microscope and Visualization of Topological Quantum Phenomena

Polarization-induced Charge Distributions at Polytype Interfaces in Semiconductor Nanostructures

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

TEM Phase Contrast Imaging in Biological and Materials Science

Abstract

Electron Holography at the Atomic Scale and the Nanoscale

Abstract