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New Approaches for Measuring Electrostatic Potentials and Charge Density Distributions in Working Devices Using Off-Axis and In-Line Electron Holography

Published online by Cambridge University Press:  27 August 2014

Rafal E. Dunin-Borkowski ,
Vadim Migunov ,
Andrew London ,
Michael Farle ,
Amir H. Tavabi  and
Giulio Pozzi
Rafal E. Dunin-Borkowski
Affiliation:
Ernst Ruska Centre for Microscopy and Spectroscopy with Electrons and Peter Gruenberg Institute, Forschungszentrum Juelich, Juelich, Germany
Vadim Migunov
Affiliation:
Ernst Ruska Centre for Microscopy and Spectroscopy with Electrons and Peter Gruenberg Institute, Forschungszentrum Juelich, Juelich, Germany
Andrew London
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford, United Kingdom
Michael Farle
Affiliation:
Fakultaet fuer Physik & Center of Nanointegration, Universitaet Duisburg-Essen, Duisburg, Germany
Amir H. Tavabi
Affiliation:
Ernst Ruska Centre for Microscopy and Spectroscopy with Electrons and Peter Gruenberg Institute, Forschungszentrum Juelich, Juelich, Germany
Giulio Pozzi
Affiliation:
Department of Physics and Astronomy, University of Bologna, Viale B. Pichat 6/2, Bologna, Italy

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 260 - 261
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Beleggia, M, et al, Ultramicroscopy 100 (2010), p. 425.Google Scholar
[2] We are grateful to Beleggia, M, Kelly, T. F, Larson, D. J for valuable discussions.Google Scholar