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Volume 11 - Issue S02 - August 2005

Contents

Page 36 of 54

Nano Scale Engineering & Self Assembly

Research Article

  • Template Synthesis of Ordered Pt Nanorods in Porous Anodic Alumina

  • Y-M Wang, H-H Kuo, M Verbrugge, J Lian, L Wang, W Zhou
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1408-1409
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Importance of Aromatic Content for Peptide/Single-Walled Carbon Nanotube Interactions

  • V Zorbas, A L Smith, A Ortiz-Acevedo, H Xie, G R Dieckmann, R K Draper, R H Baughman, I H Musselman
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1410-1411
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Growth of Carbon Nanotubes from Supported Metal Catalysts

  • Z Aslam, B Rand, R Brydson, A Brown, X Li
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1412-1413
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Structural Characterization of Carbon Nanotube Arrays Formed in Ultra-Long Nanochannels of Porous Alumina Templates

  • J Y Miao, Y Cai, Y F Chan, N Wang
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1414-1415
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

High-Resolution STEM Analysis of Functional NanoMaterials

Research Article

  • Nanostructure Functionality through Aberration-Corrected STEM

  • S J Pennycook, M F Chisholm, A R Lupini, Y Peng, K van Benthem, A Borisevich, S D Findlay, M P Oxley, L J Allen, M Varela
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1416-1417
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Cobalt Disilicide/Silicon(001) Interfaces

  • A Bleloch, M Falke, U Falke
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1418-1419
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Interpretation of High Resolution Scanning Transmission Electron Microscope Images Based on Core Loss Spectroscopy

  • M P Oxley, S D Findlay, L J Allen
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1420-1421
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Nion UltraSTEM: An Aberration-Corrected STEM for Imaging and Analysis

  • N J Bacon, G J Corbin, N Dellby, P Hrncirik, O L Krivanek, A McManama-Smith, M F Murfitt, Z S Szilagyi
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1422-1423
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Z-contrast STEM Imaging of Rare Earths Segregation at Crystal/Intergranular Film Interfaces in Si3N4 CeramicI

  • N Shibata, G S Painter, P F Becher, S J Pennycook
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1424-1425
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Imaging Dislocations in Complex Materials

  • M F Chisholm, S Kumar, P M Hazzledine
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1426-1427
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • The Aberration Corrected JEM-2200FS at Brookhaven

  • Y Zhu, R F Klie, T Tomita, H Sawada, K Nagahata
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1428-1429
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Deconvolution Processing in Analytical STEM: Monochromator for EELS and Cs-Corrector for STEM-HAADF

  • K Ishizuka
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1430-1431
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Atomic Scale Studies of the Electronic Properties of CMR Manganese Oxides

  • M Varela, V Peña, Z Sefrioui, W Tian, A R Lupini, D G Mandrus, J Santamaria, S J Pennycock
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1432-1433
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • High Spatial and Energy Resolution EELS using a Monochromated STEM

  • N D Browning, R P Erni, A Ziegler, J C Idrobo, C F Kisielowski, R O Ritchie
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1434-1435
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • STEM- and EFTEM-Analysis of Nanomaterials at High Spatial and High Energy Resolution

  • W Grogger, B Schaffer, M Rogers, G Kothleitner, F Hofer
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1436-1437
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Radiolytic Transformation of TiO2 Revisited with High Resolution EELS

  • J Neff, R R Vanfleet
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1438-1439
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Novel Method for 3d Transition Metal L2,3 ELNES by First Principles Multi-Electron Theory

  • H Ikeno, T Mizoguchi, Y Koyama, I Tanaka
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1440-1441
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Why Some Interfaces can Never be Sharp

  • D A Muller, N Nakagawa, H Y Hwang
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1442-1443
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Chemical Bonding Information from ELNES using Bond Overlap Population Diagram

  • T Mizoguchi, I Tanaka
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1444-1445
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • HAADF Imaging and Low-Loss EELS Investigation of HfO2/TiN Interfaces in High-k Gate Stacks

  • M P Agustin, L R C Fonseca, J H Hooker, S Stemmer
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1446-1447
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Page 36 of 54