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Volume 11 - Issue S02 - August 2005

Contents

Page 33 of 54

Quantitative X-ray Microanalysis

Research Article

  • Testing Win X-ray, a Monte Carlo Program for X-ray Microanalysis in the Scanning Electron Microscope

  • H Campbell, R Gauvin
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1288-1289
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Spectrum Simulation with NISTMonte

  • N W M Ritchie
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1290-1291
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Not-So-Routine Electron Probe Microanalyses of Jarosite

  • H Lowers, G Desborough, J Hammarstrom, G Swayze, K Smith, S Diehl
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1292-1293
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • NanoZAF-A Pocket-Sized Utility for Microanalytical Experiment Design

  • N M W Ritchie
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1294-1295
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Quantifying Heterogeneity in the Pu-Ga System

  • C C Davis, R E Lakis
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1296-1297
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Microanalysis of Very Fine Precipitates by FE-SEM

  • A M Elwazri, R Varano, F Siciliano, R Gauvin, S Yue
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1298-1299
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Element Ratio Maps: A More Informative Use Of Digital Elemental X-ray Maps Than Single Element Maps

  • C S Schwandt, G A McKay
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1300-1301
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Microanalysis of Hafnian Zircon

  • C Ma, G R Rossman
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1304-1305
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Measuring the Thickness of Native Plutonium Oxides Using EPMA

  • T Nothwang, C C Davis, R E Lakis
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1306-1307
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Electron Probe Microanalysis of Cr Films on Semiconducting and Insulating Substrates

  • M S Hatzistergos, E Lifshin
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1308-1309
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Evaluation of Uncertainties in Dating of Monazite by Electron Microprobe

  • C Merlet
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1310-1311
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Quantitative Electron Probe Microanalysis of Si-Ge Reference Materials

  • R B Marinenko, S Turner, D E Newbury, L Richter, L Yu, R Zeisler, D Simons
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1312-1313
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • A Multiple Collision and Finite Volume Code for Photon Transport Simulation

  • M Sumini, F Teodori, J E Fernandez, V Molinari
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1314-1315
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Scanning Electron Microscopy and X-ray Microanalysis the Next 35 Years: A Symposium Celebrating Joe Goldstein's 65th Birthday

Research Article

  • Laudatio for Joseph I. Goldstein on the Occasion of his 65th Birthday: Contributions to Meteoritics, Cosmochemistry, and Lunar Science

  • K Keil
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1316-1317
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • SEMXM—Past, Present, and Future

  • J I Goldstein
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1318-1319
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • The Process of Interpreting Images Obtained by Scanning Electron Microscopy

  • P Echlin
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1320-1321
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Nano- and Microscale Engineering of Sensors

  • A D Romig Jr, B K Cloer
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1322-1323
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • EBSD Characterization of Materials: From Meteorites to Welds to MEMS

  • J R Michael, J I Goldstein
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1324-1325
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Microscopy of Materials Used in the Semiconductor Industry

  • S M Merchant, J M DeLucca, K N Hooghan, F A Baiocchi
  • Published online by Cambridge University Press:
    01 August 2005, pp. 1326-1327
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Page 33 of 54