Microscopy and Microanalysis: Volume 26 - Issue S2

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 26 - Supplement S2 - August 2020

Impact of Recent Advancement in Instrumentation/Detectors on Electron Energy Loss Spectroscopy for Physical and Biological Sciences

Very Low Energy Electron Transmission Spectroscopy of 2D Materials

Atomic Resolution Vibrational EELS Acquired from an Annular Aperture

Determination of the Cerium Oxidation State Incorporated into MCM-41 Silica Matrix by HR-STEM Imaging and EELS Spectra

Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens

Characterization of PVD Coating and Carbo-boro-nitride Layer on ARMCO® Pure Iron

Graphite Oxide Preparation Following a Mechanochemical Green Route and Spontaneous Air Oxidation

Plasmonic Properties of Silver Amalgam Nanoparticles Studied by Analytical Transmission Electron Microscopy

Surface Characterization of Nano-sized Star Block Copolymers for Antifouling Coatings on Water Purification Membranes

Advances in Optical Microscopy Austenitic Characterization by Combination of Different Chemical Etchings

Effect of Preheating Temperature and Cooling Rate on the Microstructure Development of Welded Pearlitic Rail Steel

Morphological and Compositional Characterization of Electrochemically Active Perovskite Oxides for Sensing Biological Molecules

Effect of Salt Fog Spray and Ultraviolet Exposure on the Fracture Surface Morphology of Fiber Reinforced Polymer Composites

Wear Properties of TiN Coating on AISI M2

Reduced Magneli Layers on Anatase TiO2 Nanocrystals Surface Revealed by HAADF STEM Imaging

SEM Study of Oxidative Stage of the Electro-Fenton Process in the Treatment of Effluents from Pulp and Paper Plants

Treatment and Observation of Advanced Carbon-based Nanomaterials by Slow Electrons

Analysis of Li Ion Battery Anodes Using In-situ FIB-ToF-SIMS

Epoxy Resin Removal Technique in Cross-section Cuts for SEM

Sectioning of Cultured Cells by Ar Ion Beam Milling for SEM Observations

Correlated Post-mortem Raman and TEM Investigation of Nanoindentation Induced Structural Changes in Silicon as a Function of Temperature

Improved Microanalysis Using Cathodoluminescence Spectrum Imaging with Higher Spatial Sampling

Microscopy and Microanalysis

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Volume 26 - Supplement S2 - August 2020

Impact of Recent Advancement in Instrumentation/Detectors on Electron Energy Loss Spectroscopy for Physical and Biological Sciences

Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens