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Microscopy and Microanalysis

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 26 - Supplement S2 - August 2020

Energy and Soft Materials and the Development of Cryogenic Techniques for Studying Them

Influence of Calcination Parameters over the Morphology and Formation of Co3O4 Nanoparticles

Shape Control of Fe3O4 Nanoparticles

Advances in Microscopy for Quantum Information Sciences

Challenges in Characterizations of MTJ Thin Film Stack for Spin-transfer Torque MRAM Device by Analytical TEM in Wafer-foundries

Quantitative STEM Imaging and Multislice Simulation of Stacking Fault Defects for Exciton Trapping in GaAs

Development of a Holographic Analytical Microscope for Quantum Materials Research

Mapping and Controlling Strain in Epitaxially Connected Quantum Dot Superlattices – a Path to Designer Quantum Materials

New Single Photon Sources by Optoelectronic Tailoring of 2D Materials Using Low Energy Ion Implantation

Axial-Radial Heterostructures of Telluride Nanowire

Call of the Wild: Advances in Microanalysis and Microscopy of Geological and Extraterrestrial Materials

Fraction Crystalline from Electron Powder Patterns of Unlayered Graphene in Solidified Carbon Rain

Scanning Electron Microscopy Analysis of High Purity Libyan Desert Sandstone Silica Sand

Composition and Size Effects on the Phase of Mixed Organic/Inorganic Particles

Seasonal Variation of Nanoparticles in the Ortles Glacier, Eastern Alps

Effect of Salt Surfactant Interaction on Crystal Growth Observed Using Surface Enhanced Elipsometric Contrast (SEEC) Imaging

Efficiency and Cost Effectiveness Analysis of Water Repelling Penetrants on Aged Masonry Structures

Automated Mineralogy and Quantitative Compositional Analysis of Geological Samples on a Multi-Functional Scanning Electron Microscope

Fracture Surface Morphology of Cracked Organic Matters in Kerogen-rich Source Rock Observed in Electron Microscope

Quantitative Image Analysis of Source Rocks Using Machine Learning Segmentation

Bridging the Fundamental Electron Dose Gap for Observing Atom Processes in Complex Materials in their Native Environments

Pulsed Electron Beams for Mitigating Damage in Next-generation Electronic Materials

Low Dose HRTEM of Interfacial Melting of Cubic Ice at Low Temperature

The Ultimate Detection Limit: Building Electron Diffraction Patterns One Electron at a Time

Microscopy and Microanalysis

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Volume 26 - Supplement S2 - August 2020

Energy and Soft Materials and the Development of Cryogenic Techniques for Studying Them

Advances in Microscopy for Quantum Information Sciences

Call of the Wild: Advances in Microanalysis and Microscopy of Geological and Extraterrestrial Materials

Bridging the Fundamental Electron Dose Gap for Observing Atom Processes in Complex Materials in their Native Environments