Hostname: page-component-5c6d5d7d68-ckgrl Total loading time: 0 Render date: 2024-09-01T17:16:41.668Z Has data issue: false hasContentIssue false
  • English
  • Français

Sectioning of Cultured Cells by Ar Ion Beam Milling for SEM Observations

Published online by Cambridge University Press:  30 July 2020

Shigeyasu Tanaka  and
Yusuke Ohmi
Shigeyasu Tanaka
Affiliation:
Chubu University, Kasugai, Aichi, Japan
Yusuke Ohmi
Affiliation:
Chubu University, Kasugai, Aichi, Japan

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2692 - 2693
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Hing, H. L. et al. , Microsc Microanal 13(Suppl 2) (2007) p. 1528.Google Scholar
Tanaka, S. and Ohmi, Y., Microsc Microanal 25(Suppl 2) (2019) p. 902.10.1017/S1431927619005245CrossRefGoogle Scholar
This work was supported in part by JSPS KAKENHI Grant Number JP18K04246.Google Scholar