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Sectioning of Cultured Cells by Ar Ion Beam Milling for SEM Observations
Published online by Cambridge University Press: 30 July 2020
Abstract
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- Type
- Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens
- Information
- Copyright
- Copyright © Microscopy Society of America 2020
References
Tanaka, S. and Ohmi, Y., Microsc Microanal 25(Suppl 2) (2019) p. 902.10.1017/S1431927619005245CrossRefGoogle Scholar
This work was supported in part by JSPS KAKENHI Grant Number JP18K04246.Google Scholar