Microscopy and Microanalysis: Volume 8 - Issue S02

Only show content I have access to (813)

Over 3 years (818)

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure coreplatform@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 8 - Issue S02 - August 2002

Abstract

Electron Energy Loss Spectroscopy Study of NbC Precipitates in an Ultra-Low Carbon Hot-Rolled Microalloyed Steel

Further Applications of Energy Filtered TEM in Semiconductor Devices

Electron Beam Induced Damage in Wurtzite InN

A Next Generation Imaging Filter for High Voltage Electron Microscopy

A Faster Approach to Spectrum Imaging and Elemental Mapping in Stem

Chromophore Mapping via Low-Energy Loss Imaging in a Modified EM902: Formation of the Immune Synapse

Localization of Low Energy Losses and the Mixed Dynamic Form Factor

An EFTEM Study of Polyimide Adhesion to Single-Walled Carbon Nanotube Bundles

Transition Edge Sensor Fabrication

Detectors Capable Of High Countrates and High Speed Pulse Processing Electronics for X-Ray Spectroscopy

Development of A High Energy-resolution Soft-X-ray Spectrometer for A Transmission Electron Microscope

XML for Microanalysis: EMSA/MAS Spectrum File Format 2.0?

Spectral image analysis: Getting the most from all that data

Structure Factor Phase and Amplitude Measurement in Aln by Qcbed

Effect of Anisotropic Lattice Vibration in CBED Intensities and Detection of Local Change in Oxygen Deficiency of YBa2Cu3O7-x

A Study of Bonding in Copper by QCBED Measurements

Automated Crystallography and Grain Mapping in the TEM

Progress towards Quantitative Electron Nanodiffraction

On the Amplitude Origin Problem in Dynamical Direct Methods

Why does the hkl: h+k+l = 4n+2 reflections reveal intensity in Si [110]?

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 8 - Issue S02 - August 2002

Abstract