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Volume 12 - Issue S02 - August 2006

Contents

Page 29 of 45

Cryo-Preparation, Cryo-Sectioning, and Cryo-Approaches Using TEM, SEM, and FIB/SEM

Abstract

  • Cryo Field Emission Scanning Electron Microscopy Examination of the Ultrastructures of Agarose Based Chromatography Beads

  • DA Bell, C Santeufemio
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1124-1125
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Freeze-fracture Electron Microscopy on Lipid-stabilized Gas Bubbles

  • B Papahadjopoulos-Sternberg, J Ackrell
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1126-1127
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Application of the Nuclear Microprobe to X-ray Microanalysis of Biological Materials in Frozen-hydrated state

  • G Tylko, J Mesjasz-Przybylowicz, W Przybylowicz
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1128-1129
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Cryo - Focused Ion Beam Preparation of Biological Materials for Retrieval and Examination by Cryo - TEM.

  • EJ Basgall, D Nicastro
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1132-1133
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Combined Techniques of Chemical Fixation and Cryo-Preservation Used to Reveal Ultrastructural Details of Intracellular Pathogens

  • BT Hansen, T Hackstadt, E Fischer
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1134-1135
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Electron Energy Loss Spectroscopy for the 21st Century

Abstract

  • Retardation Effects in Valence – EELS Spectra

  • M Stöger-Pollach, C Hébert, P Schattschneider, A Laister
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1136-1137
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Image Formation Based on Atomic Resolution Core-loss Electron Energy Loss Spectroscopy

  • MP Oxley, K van Benthem, M Varela, SD Findlay, LJ Allen, SJ Pennycook
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1138-1139
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Electronic Properties of Complex Oxide Interfaces

  • M Varela, H Christen, HN Lee, S Pennycook, V Peña, Z Sefrioui, J Santamaria
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1140-1141
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Composition of 4H-SiC/SiO2 Interfaces by Electron Energy-Loss Spectroscopy

  • J Bentley, K-C Chang, Y Cao, LM Porter
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1142-1143
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Spectrum Imaging and Scatter Diagrams for the Nanoscale Morphology Characterization of Hydrated Polymers

  • A Sousa, M Libera
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1144-1145
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Electron Energy-Loss Spectroscopy with a Monochromated TEM

  • W Grogger, G Kothleitner, B Schaffer, F Hofer
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1146-1147
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Requisites for Ultimate Energy Resolution EELS and Band Gap Measurements

  • E Essers, R Hoeschen, M Matijevic, G Benner, C Koch
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1148-1149
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Atomic Resolution Elemental Map of EELS with a Cs Corrected STEM

  • E Okunishi, H Sawada, Y Kondo, M Kersker
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1150-1151
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Can Electron Energy-loss Spectroscopy Measure the Local Structure of Germanate Glasses?

  • N Jiang, J Spence
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1152-1153
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Controlled Growth and Spectroscopy Study of Oxide Nanobelts

  • ZL Wang, Y Ding
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1154-1155
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Effect of Al Addition on the Electronic Structure of Hafnia by Spatially Resolved Electron Energy Loss Spectroscopy

  • Q Li, J Dai, X Gong
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1156-1157
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Property Map by Electron Spectroscopy Imaging Series

  • F-R Chen, J-J Kai, J-J Lin, L Chang, R Egerton
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1158-1159
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Optical Properties of Carbonaceous Aerosol Particles by Low-Loss EELS

  • DT L Alexander, PA Crozier, J Anderson
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1160-1161
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Separation of Bulk and Surface-losses in Low-loss EELS Measurements in STEM

  • KA Mkhoyan, T Babinec, SE Maccagnano, EJ Kirkland, J Silcox
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1162-1163
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Page 29 of 45