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Requisites for Ultimate Energy Resolution EELS and Band Gap Measurements

Published online by Cambridge University Press:  31 July 2006

E Essers ,
R Hoeschen ,
M Matijevic ,
G Benner  and
C Koch
E Essers
Affiliation:
Carl Zeiss NTS GmbH
R Hoeschen
Affiliation:
Max Planck Institute for Metals Research,Stuttgart
M Matijevic
Affiliation:
Carl Zeiss NTS GmbH
G Benner
Affiliation:
Carl Zeiss NTS GmbH
C Koch
Affiliation:
Max Planck Institute for Metals Research,Stuttgart

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1148 - 1149
Copyright
© 2006 Microscopy Society of America