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Volume 12 - Issue S02 - August 2006

Contents

Page 26 of 45

Metallographic Preparation & Analysis of Polymer Materials

Abstract

  • Techniques for Polymer Composites Failure Analysis by Optical Microscopy

  • LM Gammon
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1004-1005
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Analytical Limits in the Analysis of Nanotechnology

Abstract

  • Synthesis and Theoretical Modeling of Crystalline Pb Nanowires.

  • P Santiago, M Perez-Alvarez, L Rendon
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1006-1007
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Picometer Scale Differences of Lattice Spacing In TEM Images

  • M Rose, P Fraundorf
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1008-1009
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Digital Darkfield Tableaus

  • P Fraundorf, J Wang, E Mandell, M Rose
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1010-1011
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • In-situ TEM Observations of Nucleation and Growth of W-nanowires on SiO2 Substrates in an Electron-beam-induced Deposition Process

  • M Song, M Kazutaka, L Zhiquan, T Masaki, F Kazuo
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1012-1013
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Spinodal Decomposition in Thick InGaN Layers Studied by Strain Field Analysis

  • T Bartel, C Kisielowski, P Specht
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1014-1015
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Determination of Projected Potential Profiles Across Interfaces Using Through Focal Series Reconstruction

  • S Bhattacharyya, CT Koch, M Rühle
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1016-1017
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Multi-length Scale Characterization of Materials from Nanometer to Millimeter

Abstract

  • Nanostructure and EELS Characterization of Diluted Magnetic Semiconductor Zn1-xCoxO Nanoneedles

  • WL Zhou, J Chen, K Sun, L Wang
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1018-1019
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Studying Trapped Grains in Alumina using SEM and EBSD

  • JL Riesterer, JK Farrer, N Ravishankar, CB Carter
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1020-1021
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Ordered Interstitial Fe Introduced New Phase In Fe2+xO3 Nanowires

  • Y Ding, JR Morber, ZL Wang, RL Snyder
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1022-1023
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • EBSD and Coupled EBSD/TEM Analysis of Zirconium Deformation Mechanisms

  • RJ McCabe, G Proust, A Misra, EK Cerreta, BL Henrie
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1024-1025
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Micro Characterization of the Diffusion of Cr in Natural Diamond Particles

  • AE Mendez, M Prelas, L Ross
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1026-1027
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • A Study of Dewetting on (001) Rutile using AFM

  • JL Riesterer, SR Gilliss, N Ravishankar, CB Carter
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1028-1029
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Characterization of Titanium Dioxide Pigment Particles by High-Resolution and Analytical Transmission Electron Microscopy (HRTEM and AEM)

  • WW Zhao
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1030-1031
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Applications in Materials Science and Engineering

Abstract

  • Monitoring Microstructure Evolution in TiAl Using TEM

  • T Novoselova, S Malinov, W Sha, TS Rong
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1032-1033
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Transmission Electron Microscopy Study of 2400 MPa Grade Co-free Maraging Steels

  • Y He, K Yang, W Sha, Z Guo, K Liu
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1034-1035
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Microstructure-mechanical Property Relationships During Processing of Experimental Dual Phase (DP800) and TRIP 600 Strip Steels

  • V Tzormpatzidi, G Fourlaris
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1036-1037
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Analyses of Phase Stabilty in Nb-Cr-Si Alloys

  • B Bewlay
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1038-1039
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Recrystallization Behavior of ECAE Processed OFHC Copper

  • D Waryoba, P Kalu
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1040-1041
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • The Effect of Cold Rolling on the Creep Behavior of Udimet 188

  • D Palit, C Boehlert
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1042-1043
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Page 26 of 45