4936 results in Electronic, optoelectronic devices, and nanotechnology
Part I - General concepts
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9 - Multiport and differential S-parameter measurements
- from Part III - Linear measurements
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- 20 June 2013, pp 219-239
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Part III - Linear measurements
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- 20 June 2013, pp 193-194
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12 - Vector network analysis for nonlinear systems
- from Part IV - Nonlinear measurements
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- 20 June 2013, pp 309-344
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Frontmatter
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5 - Vector network analyzers
- from Part II - Microwave instrumentation
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- 20 June 2013, pp 98-129
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Preface
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4 - Real-time spectrum analysis and time-correlated measurements applied to nonlinear system characterization
- from Part II - Microwave instrumentation
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- 20 June 2013, pp 64-97
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15 - Pulse and RF measurement
- from Part IV - Nonlinear measurements
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- 20 June 2013, pp 414-441
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Part IV - Nonlinear measurements
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- 20 June 2013, pp 307-308
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7 - Modular systems for RF and microwave measurements
- from Part II - Microwave instrumentation
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- 20 June 2013, pp 160-192
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8 - Two-port network analyzer calibration
- from Part III - Linear measurements
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- 20 June 2013, pp 195-218
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Index
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- 20 June 2013, pp 442-447
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2 - Microwave interconnections, probing, and fixturing
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- 20 June 2013, pp 21-38
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13 - Load- and source-pull techniques
- from Part IV - Nonlinear measurements
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- 20 June 2013, pp 345-383
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11 - TDR-based S-parameters
- from Part III - Linear measurements
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- 20 June 2013, pp 279-306
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3 - Microwave synthesizers
- from Part II - Microwave instrumentation
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- 20 June 2013, pp 41-63
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List of contributors
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6 - Microwave power measurements
- from Part II - Microwave instrumentation
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- 20 June 2013, pp 130-159
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14 - Broadband large-signal measurements for linearity optimization
- from Part IV - Nonlinear measurements
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- 20 June 2013, pp 384-413
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