4948 results in Electronic, optoelectronic devices, and nanotechnology
15 - Pulse and RF measurement
- from Part IV - Nonlinear measurements
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Part IV - Nonlinear measurements
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7 - Modular systems for RF and microwave measurements
- from Part II - Microwave instrumentation
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8 - Two-port network analyzer calibration
- from Part III - Linear measurements
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Index
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2 - Microwave interconnections, probing, and fixturing
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13 - Load- and source-pull techniques
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11 - TDR-based S-parameters
- from Part III - Linear measurements
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3 - Microwave synthesizers
- from Part II - Microwave instrumentation
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List of contributors
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6 - Microwave power measurements
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14 - Broadband large-signal measurements for linearity optimization
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- 20 June 2013, pp 384-413
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10 - Noise figure characterization
- from Part III - Linear measurements
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List of abbreviations
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Contents
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Part II - Microwave instrumentation
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1 - Transmission lines and scattering parameters
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Modern RF and Microwave Measurement Techniques
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Electromechanics and MEMS
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Appendix D - A brief review of solid mechanics
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