17 results
A FIB-SEM Based Correlative Methodology for X-Ray Nanotomography and Secondary Ion Mass Spectrometry: An Application Example in Lithium Batteries Research
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- Microscopy and Microanalysis / Volume 28 / Issue 6 / December 2022
- Published online by Cambridge University Press:
- 08 September 2022, pp. 1890-1895
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- December 2022
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Imaging and Quantification of Hydrogen in Materials: SIMS Based Correlative Microscopy
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 1606-1607
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- August 2022
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Contrast Mechanisms in Transmission Microscopy Using keV Helium Ions
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 34-35
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- August 2022
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Transmission ion microscopy and time-of-flight spectroscopy
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1930-1932
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- August 2021
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New Imaging modality for surface and sub-surface imaging using Scanning Transmission Helium Ion Microscopy
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 770-772
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- August 2021
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Multimodal characterisation on FIB instruments combining nano-scale SIMS and SE imaging
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1008-1010
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- August 2021
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Correlative Electron Microscopy, High Resolution Ion Imaging and Secondary Ion Mass Spectrometry for High Resolution Nanoanalytics on Biological Tissue
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 818-820
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- August 2020
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A method for quantitative nanoscale imaging of dopant distributions using secondary ion mass spectrometry: an application example in silicon photovoltaics
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- MRS Communications / Volume 9 / Issue 3 / September 2019
- Published online by Cambridge University Press:
- 28 August 2019, pp. 916-923
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- September 2019
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Nanoscale Correlative Imaging of Low-Z elements by in-situ Secondary Ion Mass Spectrometry in a Transmission Electron Microscope
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1778-1779
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- August 2019
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Image Fusion in SIMS-based Correlative Microscopy: Methodology and Applications
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 404-405
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- August 2018
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In Situ Correlative Microscopy Combining Transmission Electron Microscopy and Secondary Ion Mass Spectrometry
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 380-381
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- August 2018
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Secondary Ion Mass Spectrometry on the Helium Ion Microscope: methodologies for analysis of nanomaterials
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1016-1017
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- August 2018
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Distinguishing Isotopes in the Electron Microscope: In-situ TEM-SIMS Correlative Analysis
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 222-223
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- July 2016
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SIMS on the Helium Ion Microscope: a Powerful Tool for High-Resolution High-Sensitivity Nano-Analytics
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 160-161
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- July 2016
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An In Situ SEM-FIB-Based Method for Contrast Enhancement and Tomographic Reconstruction for Structural Quantification of Porous Carbon Electrodes
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- Microscopy and Microanalysis / Volume 20 / Issue 5 / October 2014
- Published online by Cambridge University Press:
- 04 August 2014, pp. 1576-1580
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- October 2014
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Correlative Microscopy Using TEM and SIMS: Parallel Ion Electron Spectrometry (PIES) for High-Resolution, High-Sensitivity Elemental Mapping for Applications in Materials Science and Biology
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 970-971
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- August 2014
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In situ break-junction sample holder for transmission electron microscopy
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- The European Physical Journal - Applied Physics / Volume 64 / Issue 3 / December 2013
- Published online by Cambridge University Press:
- 09 December 2013, 31001
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- December 2013
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