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Secondary Ion Mass Spectrometry on the Helium Ion Microscope: methodologies for analysis of nanomaterials
Published online by Cambridge University Press: 01 August 2018
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- Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1016 - 1017
- Copyright
- © Microscopy Society of America 2018
References
[1] Wirtz, T., Vanhove, N., Pillatsch, L., Dowsett, D., Sijbrandij, S.
Notte, J.
Appl. Phys. Lett. 101(4
2012
041601-1–041601-5.Google Scholar
[2] Wirtz, T., Dowsett, D.
Philipp, P.
Helium Ion Microscopy (edited by G. Hlawacek and A. Gölzhäuser
Springer
2017.Google Scholar
[4] Wirtz, T., Philipp, P., Audinot, J.-N., Dowsett, D.
Eswara, S.
Nanotechnology 26
2015
434001.Google Scholar
[5] Gratia, P., Grancini, G., Audinot, J.-N., Jeanbourquin, X., Mosconi, E., Zimmermann, I., Dowsett, D., Lee, Y., Grätzel, M., Angelis, F. De, Sivula, K., Wirtz, T.
Nazeeruddin, M. K.
J. Am. Chem. Soc. 138(49
2016
15821–15824.Google Scholar
[6] Gratia, P., Zimmermann, I., Schouwink, P., Yum, J.-H., Audinot, J.-N., Sivula, K., Wirtz, T.
Nazeeruddin, M. K.
ACS Energy Lett 2
2017
2686–2693.Google Scholar
[7]
Vollnhals, F., Audinot, J.-N., Wirtz, T., Mercier-Bonin, M., Fourquaux, I., Schroeppel, B., Kraushaar, U., Lev-Ram, V., Ellisman, M. H.
Eswara, S.
Anal. Chem. 89
2017
10702–10710.Google Scholar
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