33 results
In Situ Biasing of Tapered Si-Ge NW Heterojunctions using Off-Axis Electron Holography
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 256-257
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- August 2014
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Controlling axial p-n heterojunction abruptness through catalyst alloying in vapor-liquid-solid grown semiconductor nanowires
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1860-1861
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- July 2012
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Low-Temperature Growth of Epitaxial Semiconductor Nanostructures and Films
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- MRS Online Proceedings Library Archive / Volume 1308 / 2011
- Published online by Cambridge University Press:
- 23 March 2011, mrsf10-1308-dd06-06
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- 2011
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Dielectric Function and Band Gaps of Si1−xCx AND Si0.924−xGe0.076Cx (0≤x≤0.014) Semiconductor Alloys Grown on Si
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- MRS Online Proceedings Library Archive / Volume 379 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 211
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- 1995
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Energetic Ion Beams in Semiconductor Processing: Summary of a Doe Panel Study
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- MRS Online Proceedings Library Archive / Volume 396 / 1995
- Published online by Cambridge University Press:
- 21 February 2011, 859
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- 1995
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Stability And Precipitation Kinetics In Si1-yCy/Si and Si1-x-yGexC/Si Heterostructures Prepared by Solid Phase Epitaxy
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- MRS Online Proceedings Library Archive / Volume 321 / 1993
- Published online by Cambridge University Press:
- 15 February 2011, 467
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- 1993
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Intra-Cascade Surface Recombination of Point Defects During Ion Bombardment of Ge (001)
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- Journal:
- MRS Online Proceedings Library Archive / Volume 316 / 1993
- Published online by Cambridge University Press:
- 22 February 2011, 993
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- 1993
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Simulations of Low-Energy Ion Bombardment and Epitaxial Growth
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- MRS Online Proceedings Library Archive / Volume 235 / 1991
- Published online by Cambridge University Press:
- 28 February 2011, 743
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- 1991
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Ge Surface Displacements Due to Low Energy Particles
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- MRS Online Proceedings Library Archive / Volume 236 / 1991
- Published online by Cambridge University Press:
- 25 February 2011, 235
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- 1991
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Argon Ion Bombardment During Molecular Beam Epitaxy of Ge (001)
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- MRS Online Proceedings Library Archive / Volume 128 / 1988
- Published online by Cambridge University Press:
- 25 February 2011, 35
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- 1988
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Ion Beam Modification of Film Stress and the Effectiveness of Thin Film Encapsulants on GaAs
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- Journal:
- MRS Online Proceedings Library Archive / Volume 100 / 1988
- Published online by Cambridge University Press:
- 26 February 2011, 713
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- 1988
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Hydrogen Ion Beam Smoothening of Oxygen Roughened Ge(001) Surfaces
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- MRS Online Proceedings Library Archive / Volume 131 / 1988
- Published online by Cambridge University Press:
- 25 February 2011, 549
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- 1988
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Thermal Stability of Tasix-Gaas Schottky Barriers
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- MRS Online Proceedings Library Archive / Volume 92 / 1987
- Published online by Cambridge University Press:
- 28 February 2011, 381
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- 1987
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Stability Diagrams for Epitaxial Strained Layers
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- MRS Online Proceedings Library Archive / Volume 103 / 1987
- Published online by Cambridge University Press:
- 25 February 2011, 153
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- 1987
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The effects of P implantation on passivity of Fe—Cr alloys in acidic electrolytes
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- Journal of Materials Research / Volume 1 / Issue 6 / December 1986
- Published online by Cambridge University Press:
- 29 June 2016, pp. 752-757
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- December 1986
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Effectiveness of Thin Film Encapsulants for Reducing Evaporation during Rapid Thermal Processing of GaAs
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- MRS Online Proceedings Library Archive / Volume 74 / 1986
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- 28 February 2011, 693
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- 1986
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Ion Beam Channeling in Superlattices
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- MRS Online Proceedings Library Archive / Volume 69 / 1986
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- 25 February 2011, 69
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- 1986
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Stress Release in Ion Implanted Lattice Mismatched Semiconductor Heterostructures
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- MRS Online Proceedings Library Archive / Volume 77 / 1986
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- 26 February 2011, 417
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- 1986
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Epitaxial Formation of Rare Earth Silicides by Rapid Annealing
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- MRS Online Proceedings Library Archive / Volume 54 / 1985
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- 26 February 2011, 261
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- 1985
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Transient Conductance Measurements And Heat-Flow Analysis of Pulsed-Laser-Induced Melting of Aluminum Thin Films
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- MRS Online Proceedings Library Archive / Volume 51 / 1985
- Published online by Cambridge University Press:
- 26 February 2011, 283
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- 1985
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