7 results
2D Evaluation of the Potential Difference in an InP Device by Shadow Image Distortion Method
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1952-1954
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- August 2020
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Accurate Measurement of Electric Potential Distributions at the Interfaces in Solids Using Phase-shifting Electron Holography
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1956-1957
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- August 2020
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Quick Evaluation of Potential Difference on Al/Al3Fe Interface in a Conventional Transmission Electron Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 106-107
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- August 2019
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Differential Potential Distribution Observation in Transmission Electron Microscope with Conventional Thermal Electron Gun
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 26-27
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- August 2018
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Differential Phase Contrast Imaging with Reduced Dynamical Diffraction Effect
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1412-1413
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- July 2017
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Refined Phase Imaging by Electron Diffractive Imaging
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1614-1615
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- July 2016
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Analysis of GaAs Compound Semiconductors and the Semiconductor Laser Diode using Off-Axis Electron Holography, Lorentz Microscopy, Electron Diffraction Microscopy and Differential Phase Contrast STEM
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1975-1976
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- August 2015
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