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Microscopy and Microanalysis Microscopy and Microanalysis

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Accurate Measurement of Electric Potential Distributions at the Interfaces in Solids Using Phase-shifting Electron Holography

Published online by Cambridge University Press:  30 July 2020

Tsukasa Hirayama ,
Satoshi Anada ,
Yuki Nomura ,
Hirokazu Sasaki ,
Koh Saitoh  and
Kazuo Yamamoto
Tsukasa Hirayama
Affiliation:
Japan Fine Ceramics Center, Nagoya, Aichi, Japan
Satoshi Anada
Affiliation:
Japan Fine Ceramics Center, Nagoya, Aichi, Japan
Yuki Nomura
Affiliation:
Panasonic Corporation, Moriguchi, Osaka, Japan
Hirokazu Sasaki
Affiliation:
Furukawa Electric Co. Ltd., Yokohama, Kanagawa, Japan
Koh Saitoh
Affiliation:
Nagoya University, Nagoya, Aichi, Japan
Kazuo Yamamoto
Affiliation:
Japan Fine Ceramics Center, Nagoya, Aichi, Japan

Abstract

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Type
Direct Phase Imaging with Coherent Electron Beam in TEM
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1956 - 1957
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Copyright
Copyright © Microscopy Society of America 2020

References

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Anada, S. et al. ., Appl. Phys. Lett. 122, 225702 (2017).Google Scholar
Nomura, Y. et al. ., Angew. Chem. Int. Ed. 58, 5292 (2019).10.1002/anie.201814669CrossRefGoogle Scholar
We thank Dr. Yujin Hori, Dr. Kouhei Kinugawa, Dr. Akihiro Imamura of Furukawa Electric Co. Ltd., Dr. Satoru Ouchi, Dr. Emiko Egaki of Panasonic Corporation, and Prof. Naoya Shibata of the University of Tokyo for valuable discussions. This research was partially supported by the Project for Promoting Public Utilization of the Advanced Research Infrastructure Grant from the Ministry of Education, Culture, Sports, Science, and Technology, and Japan Society for the Promotion of Science (JSPS), Grant-in-Aid for Scientific Research KAKENHI (JP 17H02792).Google Scholar
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Accurate Measurement of Electric Potential Distributions at the Interfaces in Solids Using Phase-shifting Electron Holography
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