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Quick Evaluation of Potential Difference on Al/Al3Fe Interface in a Conventional Transmission Electron Microscope

Published online by Cambridge University Press:  05 August 2019

Katsuhiro Sasaki*
Affiliation:
Chemical Analysis Research Section, R&D Division, UACJ Corporation, Nagoya, Japan, 455-8670.
Hirokazu Sasaki
Affiliation:
Analysis Technology Center, Furukawa Electric Co. Ltd., Yokohama, Japan220-0073.
Yuta Yamamoto
Affiliation:
Chemical Analysis Research Section, R&D Division, UACJ Corporation, Nagoya, Japan, 455-8670.
Yoshiyuki Oya
Affiliation:
Chemical Analysis Research Section, R&D Division, UACJ Corporation, Nagoya, Japan, 455-8670.
*
*Corresponding author: khsasaki@nagoya-u.jp
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Abstract

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Type
Advances in Phase Retrieval Microscopy
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Tonomura, A., Reviews of Modern Physics, 59 (1987) p. 639.CrossRefGoogle Scholar
[2]Chapman, J. N., J. Phys. D, 17 (1984) p. 623.CrossRefGoogle Scholar
[3]Shabata, N., et al. , Scientific Reports 5 (2015) 10040CrossRefGoogle Scholar
[4]Sasaki, K., and Saka, H., Materials Science Forum Vol.475-479 (2005) p.4029.Google Scholar
[5]Sasaki, K., et al. , in “The Transmission Electron Microscope”, Khan, M. ed., InTech, Rijeka, (2012) p.1.Google Scholar
[6]Sasaki, K., Sasaki, H. and Saito, S., Microsc. Microanal. 24 (Suppl. 1), (2018) p.26.CrossRefGoogle Scholar
[7]“Electron Work Function of the Elements”, in CRC Handbook of Chemistry and Physics, Internet Version 2005, David R. Lide, ed., <http://www.hbcpnetbase.com>, CRC Press, Boca Raton, FL, 2005.,+CRC+Press,+Boca+Raton,+FL,+2005.>Google Scholar
[8]Dr. M. Otani, National Institute of Advanced Industrial Science and Technology (AIST) is thanked for his contributions to this work.Google Scholar
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Quick Evaluation of Potential Difference on Al/Al3Fe Interface in a Conventional Transmission Electron Microscope
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