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Differential Potential Distribution Observation in Transmission Electron Microscope with Conventional Thermal Electron Gun

Published online by Cambridge University Press:  01 August 2018

Katsuhiro Sasaki
Affiliation:
Chemical Analysis Research Section, R&D Division, UACJ Company, Nagoya, Japan
Hirokazu Sasaki
Affiliation:
Advanced Technologies R&D Laboratories, Furukawa Electric Co. Ltd., Yokohama, Japan
Sohei Saito
Affiliation:
Chemical Analysis Research Section, R&D Division, UACJ Company, Nagoya, Japan
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Abstract

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© Microscopy Society of America 2018 

References

[1] Tonomura, A. Reviews of Modern Physics 59 1987) p. 639.CrossRefGoogle Scholar
[2] Chapman, J. N. J. Phys. D 17 1984) p. 623.CrossRefGoogle Scholar
[3] Shabata, N., et al, Scientific Reports 5 2015) p. 10040.CrossRefGoogle Scholar
[4] Sasaki, K. Saka, H. Materials Science Forum 475-479 2005) p. 4029.CrossRefGoogle Scholar
[5] Sasaki, K., et al in The Transmission Electron. Microscope (ed. M. Khan InTech Rijeka p. 1.Google Scholar
[6] Sasaki, H., et al, Microscopy 63 2014) p. 235.CrossRefGoogle ScholarPubMed
[7] Takahashi, H., et al, Proc. 16th Int. Microscopy Congress 2006) p. 1104.Google Scholar
[8] The authors thank to Dr. Y Hori for his SIMS and electron holography measurements.Google Scholar
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