37 results
A Reconstruction Wizard for Electrostatic Reconstruction
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 704-705
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- August 2022
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New Product Announcement – LEAP 6000XR, New Applications, New Performance
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 3190-3191
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- August 2022
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New Product Announcement – Invizo 6000, New Applications, New Performance
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 3188-3189
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- August 2022
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Benefits of a Full Field of View in Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 706-708
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- August 2022
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Evaporation-Field Differences with Deep-UV Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1262-1264
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- August 2021
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Electrostatic Reconstruction Technology in Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 2482-2483
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- August 2021
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Directions in Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 2464-2466
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- August 2021
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Challenges in Atom Probe Tomography Instrumentation and Reconstruction
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 2038-2040
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- August 2021
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A System for Electrostatic Reconstructions
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 2622-2623
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- August 2020
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Secondary Ion Mass Spectrometry (SIMS) and Atom Probe Tomography (APT): Powerful Synergetic Techniques for Materials Scientists
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 524-525
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- August 2020
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Correlative Analysis in the Semiconductor Industry
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 2502-2503
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- August 2019
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Hardware and Software Advances in Commercially Available Atom Probe Tomography Systems
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 40-41
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- July 2017
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Atom Probe Tomography and analytical Scanning Transmission Electron Microscopy of Rapid Solidification Microstructures in Al-Cu Alloy Thin Films
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 688-689
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- July 2017
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Evolution of Atom Probe Data Collection Toward Optimized and Fully Automated Acquisition
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 616-617
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- July 2017
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Intensity of Precision Agriculture Technology Adoption by Cotton Producers
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- Agricultural and Resource Economics Review / Volume 40 / Issue 1 / April 2011
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- 15 September 2016, pp. 133-144
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Factors Influencing the Selection of Precision Farming Information Sources by Cotton Producers
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- Agricultural and Resource Economics Review / Volume 40 / Issue 2 / August 2011
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- 15 September 2016, pp. 307-320
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Atomic Scale Analysis of Dopants in CMOS Structures by Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
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- 25 July 2016, pp. 1534-1535
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- July 2016
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Correlative NanoSIMS and Atom Probe Study of Nacre: Toward Understanding Polymorphism Effects in a Chinese Pearl
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 242-243
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- July 2016
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Atom Probe Tomography of Zircon and Baddeleyite Geochronology Standards
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
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- 23 September 2015, pp. 851-852
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- August 2015
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Experimental Evaluation of Conditions Affecting Specimen Survivability in Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 849-850
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- August 2015
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