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Benefits of a Full Field of View in Atom Probe Tomography
Published online by Cambridge University Press: 22 July 2022
Abstract
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- Type
- Expanding the Limits of Atom Probe Tomography
- Information
- Copyright
- Copyright © Microscopy Society of America 2022
References
Panayi, P., “Reflectron”, United States Patent 8,134,119, March 13, 2012.Google Scholar
Bostel, A. et al. , “High Resolution Wide Angle Tomographic Probe”, United States Patent 8,074,292, December 6, 2011.Google Scholar
Bunton, J. H. and Van Dyke, M. S., “Wide Field of View Atom Probe”, United States Patent 10,615,001, April 7, 2020.Google Scholar