Microscopy and Microanalysis: Volume 28 - Issue S1

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 28 - Supplement S1 - August 2022

Plenary Speakers

Abstract

Health Versus Disease: The Facts in the Case of the Microbiota

Science is complex. It shouldn't be exclusive.

Analytical Sciences Symposia

Advances in Focused Ion Beam Instrumentation, Applications and Techniques in Materials and Life Sciences

Expanding the Energy Range from eV to MeV and Fabrication of Sources Enabling Novel Focused Ion Beam Nanofabrication and Modification

Focused Ion Beam Preparation of Low Melting Point Metals: Lessons Learned from Pb/Sn Solders

In-situ Fracture Toughness of Single Crystal Silicon Double-Cantilever Beams

FIB Sample Preparation of Hybrid Organic-Inorganic Perovskite (HOIP) Solar Cells

Taking Full Control: Leveraging Software Customizability and Open-Source Hardware to Tailor FIB Instrument Controls

Applications of a Triple Beam Microscope in Materials Science

Plasma FIB Applications in Life Science: From Large Volumes to Cryo-lamella Preparation

Possible Approaches for Combined Use of Xenon and Gallium Ion Sources for Task Specific Focused Ion Beam Sample Preparation

Using the Helium Ion Microscope for Imaging and Modification of Nanostructures, 2D Materials, and SARS-CoV-2 Infected Cells

SIMS Performed on Focused Ion Beam Instruments : In-situ Correlative Structural and Chemical Imaging

Scanning Transmission Helium Ion Microscopy- How Does It Compare to TEM?

Contrast Mechanisms in Transmission Microscopy Using keV Helium Ions

Addressing Neon Gas Field Ion Source Instability Through Online Beam Current Estimation

Cryo-FIB and Transmission Electron Microscopy of Cryoformed Metals

Electron/Ion Microscopy of Low-temperature Sintered Y-TZP Ceramics with Additive of Lithium Disilicate Glass for Dental Restorations

Image Segmentation Methods for FIB-SEM Images of Cathodes

Improving Cryo-Electron Tomography Data Quality and Throughput by Minimising Ice Contamination During Lamellae Fabrication using CERES Ice Shield

Laser Ablation: A New Approach to APT Specimen Preparation

Microscopy and Microanalysis

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Volume 28 - Supplement S1 - August 2022

Plenary Speakers

Abstract

Analytical Sciences Symposia

Advances in Focused Ion Beam Instrumentation, Applications and Techniques in Materials and Life Sciences