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Electron/Ion Microscopy of Low-temperature Sintered Y-TZP Ceramics with Additive of Lithium Disilicate Glass for Dental Restorations
Published online by Cambridge University Press: 22 July 2022
Abstract
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- Type
- Advances in Focused Ion Beam Instrumentation, Applications and Techniques in Materials and Life Sciences
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- Copyright
- Copyright © Microscopy Society of America 2022
References
EM (TEM and ToF-SIMS) research was partially supported by the AIM Lab, Maryland NanoCenter at University of Maryland.Google Scholar
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