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Laser Ablation: A New Approach to APT Specimen Preparation

Published online by Cambridge University Press:  22 July 2022

Samantha Hestad
Affiliation:
CAMECA Instruments Inc., Madison, WI, United States
Fabián Pérez-Willard
Affiliation:
Carl Zeiss Microscopy GmbH, Oberkochen, Germany
Cheryl Hartfield
Affiliation:
Carl Zeiss Microscopy, LLC, White Plains, NY, United States
Kyle Crosby
Affiliation:
Carl Zeiss Microscopy, LLC, White Plains, NY, United States
Robert Ulfig
Affiliation:
CAMECA Instruments Inc., Madison, WI, United States
Katherine Rice*
Affiliation:
CAMECA Instruments Inc., Madison, WI, United States
*
*Corresponding author: Katherine.rice@ametek.com

Abstract

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Type
Advances in Focused Ion Beam Instrumentation, Applications and Techniques in Materials and Life Sciences
Copyright
Copyright © Microscopy Society of America 2022

References

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