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Taking Full Control: Leveraging Software Customizability and Open-Source Hardware to Tailor FIB Instrument Controls
Published online by Cambridge University Press: 22 July 2022
Abstract
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- Type
- Advances in Focused Ion Beam Instrumentation, Applications and Techniques in Materials and Life Sciences
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- Copyright
- Copyright © Microscopy Society of America 2022
References
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The authors would like to thank Michael Dixon and Hitachi High-Technologies Europe for useful discussions and technical input. SuperSTEM is the UK National Research Facility for Advanced Electron Microscopy, supported by the Engineering and Physical Sciences Research Council (EPSRC).Google Scholar