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Applications of a Triple Beam Microscope in Materials Science

Published online by Cambridge University Press:  22 July 2022

Stéphanie Bessette ,
Nicolas Brodusch ,
Sima A. Alidokht ,
Bruno Noronha Castilho ,
Richard R. Chromik  and
Raynald Gauvin
Stéphanie Bessette
Affiliation:
Department of Mining and Material Engineering, McGill University, Montréal, Qc, Canada
Nicolas Brodusch
Affiliation:
Department of Mining and Material Engineering, McGill University, Montréal, Qc, Canada
Sima A. Alidokht
Affiliation:
Department of Mining and Material Engineering, McGill University, Montréal, Qc, Canada
Bruno Noronha Castilho
Affiliation:
Department of Mining and Material Engineering, McGill University, Montréal, Qc, Canada
Richard R. Chromik
Affiliation:
Department of Mining and Material Engineering, McGill University, Montréal, Qc, Canada
Raynald Gauvin
Affiliation:
Department of Mining and Material Engineering, McGill University, Montréal, Qc, Canada

Abstract

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Type
Advances in Focused Ion Beam Instrumentation, Applications and Techniques in Materials and Life Sciences
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 22 - 23
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Copyright
Copyright © Microscopy Society of America 2022

References

Suzuki, H, Hitachi Scientific Instrument News, 11 (2018) 110302.Google Scholar
Giannuzzi, L et al. , MRS Online Proceedings Library, 480 (1997), 19–27. doi:10.1557/PROC-480-19CrossRefGoogle Scholar
FIB results were collected on Hitachi Ethos NX5000 FIB-SEM located at the Facility for Electron Microscopy Research at McGill University.Google Scholar