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Scanning Transmission Helium Ion Microscopy- How Does It Compare to TEM?

Published online by Cambridge University Press:  22 July 2022

Annalena Wolff  and
Rebecca Fieth
Annalena Wolff*
Affiliation:
California Institute of Technology, Kavli Nanoscience Institute, Pasadena, CA, United States. Central Analytical Research Facility, Queensland University of Technology, Brisbane, QLD, Australia
Rebecca Fieth
Affiliation:
Central Analytical Research Facility, Queensland University of Technology, Brisbane, QLD, Australia
*
*Corresponding author: awolff@caltech.edu

Abstract

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Type
Advances in Focused Ion Beam Instrumentation, Applications and Techniques in Materials and Life Sciences
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 32 - 33
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Copyright
Copyright © Microscopy Society of America 2022

References

Allen, FI, Beilstein J Nanotechnol. 12 (2021), p. 633. doi: 10.3762/bjnano.12.52. PMID: 34285866; PMCID: PMC8261528.CrossRefGoogle Scholar
Audinot, JN et al. , Rep Prog Phys. 84(10) (2021). doi: 10.1088/1361-6633/ac1e32. PMID: 34404033.CrossRefGoogle Scholar
Emmrich, D et al. , Beilstein J Nanotechnol. 12 (2021) p. 222. doi: 10.3762/bjnano.12.18. PMID: 33728240; PMCID: PMC7934706.CrossRefGoogle Scholar
Dr. Crystal Cooper is thanked for the many useful discussions and the sample preparation suggestions.Google Scholar