Hostname: page-component-76fb5796d-r6qrq Total loading time: 0 Render date: 2024-04-25T13:29:46.668Z Has data issue: false hasContentIssue false
  • English
  • Français

Secondary Ion Mass Spectrometry (SIMS) and Atom Probe Tomography (APT): Powerful Synergetic Techniques for Materials Scientists

Published online by Cambridge University Press:  30 July 2020

Hugues Francois-Saint-Cyr ,
Isabelle Martin ,
Paula Peres ,
Christelle Guillermier ,
Ty Prosa ,
Wilfried Blanc  and
David Larson
Hugues Francois-Saint-Cyr
Affiliation:
CAMECA Instruments Inc., Madison, Wisconsin, United States
Isabelle Martin
Affiliation:
CAMECA Instruments Inc., Madison, Wisconsin, United States
Paula Peres
Affiliation:
CAMECA S.A., Gennevilliers, Ile-de-France, France
Christelle Guillermier
Affiliation:
ZEISS SMT Inc., Peabody, Massachusetts, United States
Ty Prosa
Affiliation:
CAMECA Instruments Inc., Madison, Wisconsin, United States
Wilfried Blanc
Affiliation:
Université Nice-Sophia Antipolis, Nice, Provence-Alpes-Cote d'Azur, France
David Larson
Affiliation:
CAMECA Instruments Inc., Madison, Wisconsin, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Applications of Secondary Ion Mass Spectrometry to Organic and Material Systems
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 524 - 525
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Eswara, S., et al. , Applied Physics Reviews, 6, (2019) p. 021312.10.1063/1.5064768CrossRefGoogle Scholar
Alreesh, M.A., et al. , J. Crystal Growth, 508, (2019) p. 50.10.1016/j.jcrysgro.2018.12.018CrossRefGoogle Scholar
Young, E.C., et al. , Applied Physics Letters, 109, (2016) p. 212103.10.1063/1.4968586CrossRefGoogle Scholar
Giddings, A.D., et al. , Microscopy Today, 22 (5), (2014) p.12.10.1017/S1551929514000819CrossRefGoogle Scholar
Blanc, W., et al. , J. Physical Chemistry C, 123 (47), (2019) p. 29008.10.1021/acs.jpcc.9b08577CrossRefGoogle Scholar