Skip to main content Accessibility help
×
Home
Hostname: page-component-99c86f546-t82dr Total loading time: 0.252 Render date: 2021-12-04T02:41:18.197Z Has data issue: true Feature Flags: { "shouldUseShareProductTool": true, "shouldUseHypothesis": true, "isUnsiloEnabled": true, "metricsAbstractViews": false, "figures": true, "newCiteModal": false, "newCitedByModal": true, "newEcommerce": true, "newUsageEvents": true }

Secondary Ion Mass Spectrometry (SIMS) and Atom Probe Tomography (APT): Powerful Synergetic Techniques for Materials Scientists

Published online by Cambridge University Press:  30 July 2020

Hugues Francois-Saint-Cyr
Affiliation:
CAMECA Instruments Inc., Madison, Wisconsin, United States
Isabelle Martin
Affiliation:
CAMECA Instruments Inc., Madison, Wisconsin, United States
Paula Peres
Affiliation:
CAMECA S.A., Gennevilliers, Ile-de-France, France
Christelle Guillermier
Affiliation:
ZEISS SMT Inc., Peabody, Massachusetts, United States
Ty Prosa
Affiliation:
CAMECA Instruments Inc., Madison, Wisconsin, United States
Wilfried Blanc
Affiliation:
Université Nice-Sophia Antipolis, Nice, Provence-Alpes-Cote d'Azur, France
David Larson
Affiliation:
CAMECA Instruments Inc., Madison, Wisconsin, United States
Rights & Permissions[Opens in a new window]

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Applications of Secondary Ion Mass Spectrometry to Organic and Material Systems
Copyright
Copyright © Microscopy Society of America 2020

References

Eswara, S., et al. , Applied Physics Reviews, 6, (2019) p. 021312.10.1063/1.5064768CrossRefGoogle Scholar
Alreesh, M.A., et al. , J. Crystal Growth, 508, (2019) p. 50.10.1016/j.jcrysgro.2018.12.018CrossRefGoogle Scholar
Young, E.C., et al. , Applied Physics Letters, 109, (2016) p. 212103.10.1063/1.4968586CrossRefGoogle Scholar
Giddings, A.D., et al. , Microscopy Today, 22 (5), (2014) p.12.10.1017/S1551929514000819CrossRefGoogle Scholar
Blanc, W., et al. , J. Physical Chemistry C, 123 (47), (2019) p. 29008.10.1021/acs.jpcc.9b08577CrossRefGoogle Scholar
You have Access

Send article to Kindle

To send this article to your Kindle, first ensure no-reply@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about sending to your Kindle. Find out more about sending to your Kindle.

Note you can select to send to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be sent to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Secondary Ion Mass Spectrometry (SIMS) and Atom Probe Tomography (APT): Powerful Synergetic Techniques for Materials Scientists
Available formats
×

Send article to Dropbox

To send this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Dropbox.

Secondary Ion Mass Spectrometry (SIMS) and Atom Probe Tomography (APT): Powerful Synergetic Techniques for Materials Scientists
Available formats
×

Send article to Google Drive

To send this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Google Drive.

Secondary Ion Mass Spectrometry (SIMS) and Atom Probe Tomography (APT): Powerful Synergetic Techniques for Materials Scientists
Available formats
×
×

Reply to: Submit a response

Please enter your response.

Your details

Please enter a valid email address.

Conflicting interests

Do you have any conflicting interests? *