34 results
C07 Synchrotron Applications in Archaeometallurgy: Analysis of High Zinc Brass Astrolabes
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- Powder Diffraction / Volume 18 / Issue 2 / June 2003
- Published online by Cambridge University Press:
- 20 May 2016, p. 176
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Synchrotron applications in archaeometallurgy: Analysis of high zinc brass astrolabes
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- Powder Diffraction / Volume 19 / Issue 1 / March 2004
- Published online by Cambridge University Press:
- 06 March 2012, pp. 12-15
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Designing a nutrition-based intervention using a novel cooperative learning model
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- Proceedings of the Nutrition Society / Volume 68 / Issue OCE2 / 2009
- Published online by Cambridge University Press:
- 27 October 2009, E99
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Grain-Scale Strain and Orientation Measurements during Electromigration in Al Conductor Lines by Synchrotron X-Ray Microbeam Diffraction
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- MRS Online Proceedings Library Archive / Volume 1027 / 2007
- Published online by Cambridge University Press:
- 01 February 2011, 1027-D01-04
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- 2007
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Thermal and Electromigration-Induced Strains in Copper Conductor Lines: X-ray Microbeam Measurements and Analysis
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- MRS Online Proceedings Library Archive / Volume 914 / 2006
- Published online by Cambridge University Press:
- 01 February 2011, 0914-F06-06
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- 2006
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Electrical Resistance Anomalies During Electromigration Testing of Cu Conductor Lines: Examples of Local Melting?
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- MRS Online Proceedings Library Archive / Volume 914 / 2006
- Published online by Cambridge University Press:
- 01 February 2011, 0914-F06-08
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- 2006
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White Beam X-ray Microdiffraction Analysis of Polycrystalline Thin Films
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- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 1024-1025
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- August 2004
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Electron Beam Bombardment Induced Decrease of Cathodoluminescence Intensity from GaN Not Caused by Absorption in Buildup of Carbon Contamination
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- Journal:
- Materials Research Society Internet Journal of Nitride Semiconductor Research / Volume 9 / 2004
- Published online by Cambridge University Press:
- 13 June 2014, e8
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- 2004
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Cathodoluminescence, Electroluminescence, and Degradation of ZnCdSe Quantum Well Light Emitting Diodes
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- MRS Online Proceedings Library Archive / Volume 764 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, C3.18
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- 2003
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Confocal Photoluminescence and Cathodoluminescence Studies of AlGaN
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- MRS Online Proceedings Library Archive / Volume 798 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, Y5.64.
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- 2003
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X-ray Microbeam Diffraction Measurements in Polycrystalline Aluminum and Copper Thin Films
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- MRS Online Proceedings Library Archive / Volume 795 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, U1.7
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- 2003
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Effects of Electric Fields on Cathodoluminescence from II-VI Quantum Well Light Emitting Diodes
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- MRS Online Proceedings Library Archive / Volume 692 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, H9.26.1
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- 2001
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Cathodoluminescence of Lateral Epitaxial Overgrowth GaN: Dependencies on Excitation Conditions
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- MRS Online Proceedings Library Archive / Volume 622 / 2000
- Published online by Cambridge University Press:
- 15 March 2011, T5.2.1
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- 2000
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Concentration and Stress Evolution During Electromigration in Passivated Al(0.25 at. % Cu) Conductor Lines
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- MRS Online Proceedings Library Archive / Volume 612 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, D1.8.1
- Print publication:
- 2000
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Strain Measurements from Single Grains in Passivated Aluminum Conductor Lines by X-Ray Microdiffraction During Electromigration
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- MRS Online Proceedings Library Archive / Volume 612 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, D8.6.1
- Print publication:
- 2000
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Effects of Y and Zr Dopants on Grain Boundary Structure in Creep Resistant Polycrystalline Alumina
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- MRS Online Proceedings Library Archive / Volume 654 / 2000
- Published online by Cambridge University Press:
- 21 March 2011, AA1.1.1
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- 2000
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Degradation of Luminescence from GaN During Electron Bombardment: Effects of Beam Voltage, Current and Scanned Area
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- MRS Online Proceedings Library Archive / Volume 639 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, G6.27
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- 2000
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X-Ray Microbeam Studies of Electromigration
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- MRS Online Proceedings Library Archive / Volume 563 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 153
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- 1999
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In-Situ X-Ray Microbeam Cu Fluorescence and Strain Measurements on Al(0.5 AT.% Cu) Conductor Lines During Electromigration
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- MRS Online Proceedings Library Archive / Volume 563 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 163
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- 1999
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Thermal and Electromigration Strain Distributions in 10 μm-Wide Aluminum Conductor Lines Measured by X-Ray Microdiffraction
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- MRS Online Proceedings Library Archive / Volume 473 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 273
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- 1997
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