Microscopy and Microanalysis: Volume 26 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 26 - December 2020

In situ TEM at the Extremes - Extreme Temperature and Biasing

Atomic Scale Tracking of a Charge Order Transition with Continuously Variable Temperature Cryo-STEM

In Situ TEM at the Extremes - Liquid environment

In Situ Atomic-scale Observation of Thermal-induced Detwinning in Face-centered Cubic Metals

Approaching Operando Imaging of Functional Materials

Visualizing Chemical Processes in Semiconductors with In Situ TEM

Probing Composition Distribution in Nanoalloy Catalysts with Correlative Electron Microscopy

Self-assembly of Periodical < C >-screw Dislocation Array in Hot-compressed Pure Magnesium

Operando Imaging of Ion Migration in Metal Halide Perovskites

Call of the Wild: Advances in Microanalysis and Microscopy of Geological and Extraterrestrial Materials

Putting Planetary Materials into the Gap: Insights into Planetary and Stellar Processes from in Situ Measurements in the TEM

TEM Structural and Compositional Studies of Presolar SiC Grains and Their Relation to Raman Spectra

A Sintered and Sulfidized Equilibrated Aggregate from an Interplanetary Dust Particle

3D Microstructural and Microanalytical Analyses of Wark-Lovering Rims in the Allende Meteorite

Fast, Computer-Assisted Detection of μm-Scale Dust Impact Craters on Spacecraft Materials

Bridging the Fundamental Electron Dose Gap for Observing Atom Processes in Complex Materials in their Native Environments

Pulsed-Laser-Driven TEM for Studying Temporal Aspects of Beam Damage

Sputtering During Microanalysis in the Analytical Electron Microscope

Soft X-ray Scanning Transmission Microscopy Studies of Radiation Damage by Electron, Ion and X-ray Beams

Collaborative Analysis Using Atom Probe Tomography Including TEM/APT Characterization of Metal Alloys and Other Material Systems

An Atom-probe Tomographic Study of Kinetic Pathways of Retention Excesses and Depletions at Gamma(F.C.C.)/gamma-prime (L12) Interfaces in a Ni-Al-Cr-Re Superalloy

Exploration of Novel Ordering Mechanism in Titanium Alloys Using Atom Probe Tomography and Aberration-corrected Scanning Transmission Electron Microscopy

Alpha Shape Analysis: Extracting Composition, Surface Area, and Volume Post Clustering

Silicon-standard-based Comparisons of LEAP Accuracy and Precision

Phase Stability and Microstructural Evolution in Vanadium-Titanium Alloys with Oxygen Dissolution and Varying Titanium-content

Technologists' Forum - Negative Staining of Small Molecules in Non-CryoEM Facilities

Preparation of Liposomes for Negative Staining TEM

Microscopy and Microanalysis

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Volume 26 - December 2020

In situ TEM at the Extremes - Extreme Temperature and Biasing

In Situ TEM at the Extremes - Liquid environment

Approaching Operando Imaging of Functional Materials

Call of the Wild: Advances in Microanalysis and Microscopy of Geological and Extraterrestrial Materials

Bridging the Fundamental Electron Dose Gap for Observing Atom Processes in Complex Materials in their Native Environments

Collaborative Analysis Using Atom Probe Tomography Including TEM/APT Characterization of Metal Alloys and Other Material Systems

Technologists' Forum - Negative Staining of Small Molecules in Non-CryoEM Facilities