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Atomic Scale Tracking of a Charge Order Transition with Continuously Variable Temperature Cryo-STEM

Published online by Cambridge University Press:  30 July 2020

Noah Schnitzer
Affiliation:
Cornell University, Ithaca, New York, United States
Elisabeth Bianco
Affiliation:
Cornell University, Ithaca, New York, United States
Alemayehu Admasu
Affiliation:
Rutgers University, Piscataway, New Jersey, United States
Jaewook Kim
Affiliation:
Rutgers University, Piscataway, New Jersey, United States
Sang-Wook Cheong
Affiliation:
Rutgers University, Piscataway, New Jersey, United States
Ismail El Baggari
Affiliation:
Cornell University, Ithaca, New York, United States
Lena Kourkoutis
Affiliation:
Cornell University, Ithaca, New York, United States

Abstract

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Type
In situ TEM at the Extremes - Extreme Temperature and Biasing
Copyright
Copyright © Microscopy Society of America 2020

References

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This work was supported by AFOSR (FA 9550-16-1-0305) and NSF (DMR-1539918, DMR-1429155, DMR-1719875).Google Scholar