Microscopy and Microanalysis: Volume 26 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 26 - December 2020

Vendor Symposium - Materials Preparation

Automation of In-trench TEM Lamella Workflow Increasing Throughput for Lift-out

Advances in Large-area Sample Preparation Using Broad Argon Ion Beam Milling for Multiphase Materials

Towards the Nanoscale-ultrathin Metal Coatings as a Solution for Imaging of Fine-scale Structures

PhysicalBrickDatum: A Deep Physical Model for N-Dimensional Microscopy Data

A Path to EUV Photoresist Reference Metrology Using Restricted Tilt Electron Tomography

The Promise of Cryo-Electron Tomography

In Situ Structural Analysis of Bacterial Nanomachines by Combining Cryo-FIB Milling, Cryo-ET and Sub-tomogram Analysis

Whole-cell Cryo-ET Structural Studies of Respiratory Syncytial Virus

Correlative Cryo-electron Tomography to Study Native Protein Organization and Membrane Architecture in Cells

Microbes in Focus

The Host Cell Recognition and Penetration Apparatus of Staphylococcal Bacteriophages

Focus on Nematodes: Microscopic Roundworms

Multiplexing Bacteriophage Capsids for Medium Throughput Structure Determination

Electron Tomography Revealed Compact DNA in the Nucleus-like Compartment, Formed in the Bacterial Cell During Infection by the phiKZ Bacteriophage

Energy and Soft Materials and the Development of Cryogenic Techniques for Studying Them

The Application of Cryogenic TEM for Studying Protein–Metal–Organic Frameworks

Soft Microscopy: Multimodal, Correlative and Dynamic Characterization of Soft and Hybrid Structures

Microscopy-Based Approaches to Characterizing Analogs of Classical Electrons in Colloidal Crystals Engineered with DNA

Advances in Microscopy for Quantum Information Sciences - Diamond

Correlative Measurement of Color Centres in Nanodiamond Using Optical and Advanced Electron Microscopy and Spectroscopy

Time-resolved Cathodoluminescence in a Transmission Electron Microscope Applied to NV Centers in Diamond

New Diamond Structures Observed by Aberration-corrected TEM

In situ TEM at the Extremes - Extreme Temperature and Biasing

Low Temperature Electron Microscopy and Manipulation of Electronic Order

Investigation of Solid-state Transformations Under Extreme Thermal Transients Using In-situ TEM Heating Experiments

Microscopy and Microanalysis

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Volume 26 - December 2020

Vendor Symposium - Materials Preparation

The Promise of Cryo-Electron Tomography

Microbes in Focus

Energy and Soft Materials and the Development of Cryogenic Techniques for Studying Them

Advances in Microscopy for Quantum Information Sciences - Diamond

In situ TEM at the Extremes - Extreme Temperature and Biasing