Hostname: page-component-848d4c4894-cjp7w Total loading time: 0 Render date: 2024-06-17T13:51:34.387Z Has data issue: false hasContentIssue false
  • English
  • Français

Advances in Large-area Sample Preparation Using Broad Argon Ion Beam Milling for Multiphase Materials

Published online by Cambridge University Press:  30 July 2020

Pawel Nowakowski ,
Mary Ray  and
Paul Fischione
Pawel Nowakowski
Affiliation:
E.A. Fischione Instruments Inc., Export, Pennsylvania, United States
Mary Ray
Affiliation:
E.A. Fischione Instruments Inc., Export, Pennsylvania, United States
Paul Fischione
Affiliation:
E.A. Fischione Instruments Inc., Export, Pennsylvania, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Vendor Symposium - Materials Preparation
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1982 - 1984
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Nowakowski, P., Wiezorek, J., Spinelli, I., Ray, M., & Fischione, P. (2019). Elastic and plastic strain measurement using electron backscatter diffraction technique: The influence of sample preparation. Microscopy and Microanalysis, 25(S2), 534-535.10.1017/S1431927619003404CrossRefGoogle Scholar
Nowakowski, P., Bonifacio, C., Ray, M., & Fischione, P. (2019). Combining emerging sample preparation methods, SEM, and TEM investigations for microelectronics device characterization at multiple scales. Microscopy and Microanalysis, 25(S2), 688-689.10.1017/S1431927619004173CrossRefGoogle Scholar
Nowakowski, P., Wiezorek, J., Bathula, V., Mielo, S., Khanal, S., Bonifacio, C., & Fischione, P. (2018). SEM and TEM characterization of plastic deformation structures in aluminum by EBSD, TKD, and PED-based orientation imaging techniques. Microscopy and Microanalysis, 24(S1), 2182-2183.10.1017/S143192761801139XCrossRefGoogle Scholar
Nowakowski, P., Bonifacio, C. S., Campin, M. J., Ray, M. L., Fischione, P. E., & Mathieu, S. (2017). EBSD and TEM microstructural studies of new fuel cladding in generation IV sodium-cooled fast nuclear reactors. Microscopy and Microanalysis, 23(S1), 2224-2225.10.1017/S1431927617011783CrossRefGoogle Scholar
Nowakowski, P., Schlenker, J., Ray, M., & Fischione, P. (2016). Sample preparation using broad argon ion beam milling for electron backscatter diffraction (EBSD) analysis. Microscopy and Microanalysis, 22(S3), 12-13.10.1017/S143192761600091XCrossRefGoogle Scholar
Wright, I., Nowell, M.M., Field, D.P., (2011). A Review of Strain Analysis Using Electron Backscatter Diffraction Microscopy and Microanalysis, 17, 316-329.Google Scholar
Katrakova, F. Mucklich, (2002). Specimen preparation for electron backscatter diffraction - Part II: Ceramics, Pract. Metallog. 39, 644-662Google Scholar