Hostname: page-component-76fb5796d-x4r87 Total loading time: 0 Render date: 2024-04-26T21:39:08.306Z Has data issue: false hasContentIssue false
  • English
  • Français

Alpha Shape Analysis: Extracting Composition, Surface Area, and Volume Post Clustering

Published online by Cambridge University Press:  30 July 2020

Evan Still  and
Peter Hosemann
Evan Still
Affiliation:
University of California Berkeley, Berkeley, California, United States
Peter Hosemann
Affiliation:
University of California Berkeley, Berkeley, California, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Collaborative Analysis Using Atom Probe Tomography Including TEM/APT Characterization of Metal Alloys and Other Material Systems
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2080 - 2082
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Geiser, B. P. et al. , Microscopy and Microanalysis 13 (2007), p. 43710.1017/S1431927607070948CrossRefGoogle Scholar
Geiser, B. P. B. P. et al. , Microscopy and Microanalysis 15 (2009), p. 29210.1017/S1431927609098249CrossRefGoogle Scholar
Marquis, E. A. and Hyde, J. M., Materials Science and Engineering: R: Reports 69 (2010), p. 3710.1016/j.mser.2010.05.001CrossRefGoogle Scholar
Bas, P. et al. , Applied Surface Science 87–88 (1995), p. 29810.1016/0169-4332(94)00561-3CrossRefGoogle Scholar
Wang, J. et al. , Microscopy and Microanalysis 25 (2019), p. 33810.1017/S1431927618015386CrossRefGoogle Scholar
Ghamarian, I. and Marquis, E. A., Ultramicroscopy 200 (2019), p. 2810.1016/j.ultramic.2019.01.011CrossRefGoogle Scholar
Vaumousse, D., Cerezo, A., and Warren, P. J., Ultramicroscopy 95 (2003), p. 21510.1016/S0304-3991(02)00319-4CrossRefGoogle Scholar
Guo, Z., Sha, W., and Vaumousse, D., Acta Materiala 51 (2003), p. 10110.1016/S1359-6454(02)00353-1CrossRefGoogle Scholar
Felfer, P. et al. , Ultramicroscopy 150 (2015), p. 3010.1016/j.ultramic.2014.11.015CrossRefGoogle Scholar
Edelsbrunner, H., Kirkpatrick, D., and Seidel, R., IEEE Transactions on Information Theory 29 (1983), p. 55110.1109/TIT.1983.1056714CrossRefGoogle Scholar